Measurement of Sample Tilt by Residual Imprint Morphology of Berkovich Indenter

Abstract

The tilt between sample surface and indenter is the premise for taking into consideration the effect of sample tilt on indentation measurement by some correction functions. A theoretical approach is proposed to measure the tilt angle and rotation angle of a tilted sample by the residual imprint morphology of the Berkovich indenter. The tilt angle and rotation angle are defined in the Cartesian coordinate system at the tip of the Berkovich indenter, which is ideal and whose axis is along the vertical direction. The normal of the sample surface can be calculated with unique solutions by solving the equations with the projected contact lengths of indenter edges as input values, which can be measured directly from the residual imprint after indentation. Tilt angle and rotation angle can be calculated from sample surface normal.

Micromechanical characterization of microwave dielectric ceramic BaO–Sm2O3–5TiO2by indentation and scratch methods

“…For a higher sensitivity factor, the value of AE signal Va is C×Vi, where Vi is the input signal, and C is the sensitivity factor, and AE (%) value (= Va/Vmax×100%) corresponds to Va divided by the maximum range Vmax of 5 V. Since sample tile can affect scratch response [75,77], surface tilt angle was measured to be 0.15° by the pre-scan of the initial surface profile, resulting in negligible effect of sample tilt.…”