2002
DOI: 10.4028/www.scientific.net/msf.404-407.809
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Measurement of Stress in Phosphated-Iron Oxide Layers by In-Situ Diffraction of Synchrotron Radiation

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Cited by 3 publications
(4 citation statements)
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“…The magnetite in all of the 5 investigated samples contains compressive in-plane residual stresses. The magnitude of the average residual stresses in the 966 Residual Stresses VII, ECRS7 magnetite of the oxide layers, regarding the experimental error margin, is almost the same and agrees well with earlier measurements [10,13]. A relation between substrate roughness and compressive residual stress in the magnetite is not obvious.…”
Section: Resultssupporting
confidence: 89%
See 1 more Smart Citation
“…The magnetite in all of the 5 investigated samples contains compressive in-plane residual stresses. The magnitude of the average residual stresses in the 966 Residual Stresses VII, ECRS7 magnetite of the oxide layers, regarding the experimental error margin, is almost the same and agrees well with earlier measurements [10,13]. A relation between substrate roughness and compressive residual stress in the magnetite is not obvious.…”
Section: Resultssupporting
confidence: 89%
“…Texture of the MagnetiteResidual Stresses. Measurements of the average residual stresses in magnetite using the sin 2 ψmethod revealed linear sin 2 ψ curves without ψ splitting, which is in agreement with earlier observations [e.g 10,12,13]…”
supporting
confidence: 92%
“…Experimental stress analyses by [18] in the early stage of the scale formation on a-Fe reveal cooling stresses of approximately À 260 MPa in the a-Fe 2 O 3 and approximately À 170 MPa in the Fe 3 O 4 . This agrees well with stress values obtained from the straight forward calculation using the elastic modulus value given in [57] for compact a-Fe 2 O 3 and in [58] for FeO, which yields À 50 MPa in the FeO and À 280 MPa in the a-Fe 2 O 3 .…”
Section: Residual Stresses After Coolingmentioning
confidence: 99%
“…Time-resolved X-ray diffraction measurements (millisecond measurement time) will make the investigation of fast kinetics possible, for instance phase transitions or self-propagating high temperature synthesis [28]. The study of thin films and interfaces, in particular to determine their mechanical properties (strain measurements and stress determination), will be an important application field of the DiffAbs beamline [29,30].…”
Section: Coupled Absorption-diffractionmentioning
confidence: 99%