2018
DOI: 10.1002/pssa.201700630
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Measurement of the Emission Lifetime of a GaN Interface Fluctuation Quantum Dot by Power Dependent Single Photon Dynamics

Abstract: Photon autocorrelation measurements are used to investigate the power dependent single photon emission of recently reported interface fluctuation GaN quantum dots (QDs), which exhibit relatively narrow emission linewidths. The intrinsic exciton lifetime of such a dot is evaluated to be 2.0 ± 0.1 ns from its power dependent single photon dynamics. This result is comparable with typical SK GaN QDs that emit at similar energy, and provides further evidence that the relatively narrow emission linewidth in such str… Show more

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Cited by 8 publications
(3 citation statements)
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“…Figure 4d shows the PL lifetime of the MoSe2 QDs on the heterostructures, which was measured by excitation with a 640 nm, ~200 ps, 10MHz pulsed diode laser and sending the spectrally filtered output around the quantum dot wavelength to a single-photoncounting APD. The measured long lifetime of ~ 3 ns from the exponential fitting (black line) is consistent with the behavior shown by typical III-V semiconductor quantum dots [38][39][40][41] .…”
Section: The Quantum Confinement Of Excitons In Thesupporting
confidence: 84%
“…Figure 4d shows the PL lifetime of the MoSe2 QDs on the heterostructures, which was measured by excitation with a 640 nm, ~200 ps, 10MHz pulsed diode laser and sending the spectrally filtered output around the quantum dot wavelength to a single-photoncounting APD. The measured long lifetime of ~ 3 ns from the exponential fitting (black line) is consistent with the behavior shown by typical III-V semiconductor quantum dots [38][39][40][41] .…”
Section: The Quantum Confinement Of Excitons In Thesupporting
confidence: 84%
“…The macro steps in the quantum well (that conforms with the profile of the hillock) lead to additional lateral confinement in the well. It is theorized that higher temperature growth used for these samples results in a cleaner environment with a lower density of charge traps [37,86] than traditional GaN/AlN QDs. This lower density of defects ultimately leads to reduced spectral diffusion.…”
Section: Spectral Diffusion and Emission Linewidthsmentioning
confidence: 99%
“…The g (2) ( t ) traces (Figure b) show that the QD excitation lifetime increases at low pumping powers. For quantitative analysis, the measured g (2) ( t ) traces at each pump power were fitted using the equation g false( 2 false) false( t false) = 1 a e false| t false| / τ , following the procedure in refs . Here a represents the purity of the single photon source such that a = 1 – g (2) ( t = 0) and τ represents the lifetime of the QD.…”
mentioning
confidence: 99%