2013
DOI: 10.1149/05014.0071ecst
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Measurement Science for "More-Than-Moore" Technology Reliability Assessments

Abstract: In this paper, we will present an overview of metrology issues and some of the techniques currently under development in our group at NIST, aimed at understanding some of the potential performance limiting issues in such highly integrated systems. We will discuss our attempts to identify and characterize the various types of defects and relate them to where and why they form, without interrupting the responsible phenomena.

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“…The challenges lie in developing low-power devices based on CMOS that goes into the third dimensions on improvements in advanced materials technology [103]. The emerging directions of the above-stated research gaps are to develop a virtual paradigm for self re-configurable computing architectures that reach beyond Moore's law [104].…”
Section: Spintronics Based Computingmentioning
confidence: 99%
“…The challenges lie in developing low-power devices based on CMOS that goes into the third dimensions on improvements in advanced materials technology [103]. The emerging directions of the above-stated research gaps are to develop a virtual paradigm for self re-configurable computing architectures that reach beyond Moore's law [104].…”
Section: Spintronics Based Computingmentioning
confidence: 99%