Measurement system for test memory cells based on keysight B1500A semiconductor device analyzer running LabVIEW software

Shvetsov-Shilovskiy, Ivan I.; Boruzdina, Anna B.; Ulanova, Anastasia V.; Орлов, А. А.; Amburkin, K. M.; Nikiforov, Alexander Y.

doi:10.1109/sibcon.2017.7998542

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Measurement system for test memory cells based on keysight B1500A semiconductor device analyzer running LabVIEW software

Cited by 6 publications

References 19 publications

FRAM test memory cells radiation hardness research

FRAM test memory cells radiation hardness research

Effects of space radiation on resistive memory and comparison with other types of non-volatile memory

Measurement of Parameters of Analog-to-Digital Converters Based on the NI Hardware-Software Complex in the Course of a Radiation Experiment

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