Measuring Power Distribution System Resistance Variations

Helinski, Ryan; Plusquellic, Jim

doi:10.1109/tsm.2008.2001222

Cited by 7 publications

(6 citation statements)

References 20 publications

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“…In research work conducted by Helinski , et al [59], a power grid architecture is adopted that is first proposed by Helinski and Plusquellic in [60] to design PG‐PUF. It is based on measuring equivalent resistance variations in the power distribution system of an IC.…”

Section: Literature Reviewmentioning

confidence: 99%

“…The scheme arises another problem that when two RO-PUF units' oscillators have exactly the same speed order. For example, two RO-PUF units U 1 and U 2 with the frequencies (80,60,70) and (40,20,30). The speed order for both units' oscillators is (3rd, 1st, 2nd), which results in the same response for a particular challenge.…”

Section: Ring Oscillator Puf: Suh and Devadas Introduced Ro-pufmentioning

confidence: 99%

“…However, we evaluated that the problem is still not fully solved as explored below by considering the previously mentioned example, the speed order for both units' oscillators is (3rd, 1st, 2nd). Finding the subsets of the units' frequencies including ( (80,60), (80,70), (60,70), (80,60,70)) and ((40, 20), (40,30), (20,30), (40,20,30)). By considering the Euclidean metric for these groups, the Q-value for both RO-PUF oscillators is same as (400, 100, 100, 600) that also result in the same response for two appropriate challenges.…”

Section: Ring Oscillator Puf: Suh and Devadas Introduced Ro-pufmentioning

confidence: 99%

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Physical unclonable function: architectures, applications and challenges for dependable security

Ning

Farha

Ullah

et al. 2020

IET Circuits, Devices & Systems

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Physical unclonable function (PUF) is hardware-specific security primitive for providing cryptographic functionalities that are applicable for secure communication among the embedded devices. The physical structure of PUF is considered to be easy to manufacture but hard or impossible to replicate due to variations in its manufacturing process. However, a large community of analytics believes hardware-based PUF has paved the way for its realisation in providing dependable security. In this study, the authors have thoroughly explored the architecture, applications, requirements, and challenges of PUF that provide security solutions. For presenting the literature, they have designed a taxonomy where PUFs are divided under two main categories, including non-silicon and silicon-based PUF. Currently, there is no comprehensive survey that highlights the comparison and usability of memory-based and analogue/mixed-signal based PUF that are considered to be suitable as compared to counterparts. In a similar vein, they have presented the network-specific application scenarios in wireless sensor network, wireless body area network and Internet of Things and then identified the strong, weak and controlled PUF in a categorical manner. Moreover, they have presented a number of prospective limitations that are identified in PUF structures and then identified the open research challenges to meet the desired security levels.

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Section: Literature Reviewmentioning

confidence: 99%

Section: Ring Oscillator Puf: Suh and Devadas Introduced Ro-pufmentioning

confidence: 99%

Section: Ring Oscillator Puf: Suh and Devadas Introduced Ro-pufmentioning

confidence: 99%

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Physical unclonable function: architectures, applications and challenges for dependable security

Ning

Farha

Ullah

et al. 2020

IET Circuits, Devices & Systems

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“…This approach can also be used to determine the effective resistance in any two layer mesh structure with different horizontal and vertical unit resistances. The effective resistance of a mesh is used in power grid analysis [5], [6], substrate analysis [7], decoupling capacitance allocation [8]- [11], power dissipation [12] and electrostatic discharge (ESD) analysis [12], and measuring resistance variations in power distribution networks [13]. The effective resistance is used to determine the effective region of a decoupling capacitor [8], [14].…”

Section: Introductionmentioning

confidence: 99%

Effective Resistance in a Two Layer Mesh

P.-Vaisband¹,

Jakushokas²,

Popovich³

et al. 2016

On-Chip Power Delivery and Management

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The effective resistance of a resistive mesh is a commonly used analogy for various scientific and engineering problems such as IR voltage drop estimation, distributed control including time synchronization and sensor localization, determining the chemical distance among multiple bonds, and finding the distance between two vertices in a graph. Resistive networks are a commonly used structure in electronics to model different elements of an integrated circuit, such as a physical substrate, an integrated circuit layout, and a power distribution network. On-chip power and ground networks are composed of orthogonal metal lines from different metal layers, and a resistive mesh is typically used to model these networks. A two layer mesh is therefore commonly used to analyze IR voltage drops and decoupling capacitor placement. A closed-form expression is described here for the effective resistance between the intersections of a two layer resistive mesh where the horizontal and vertical unit resistances are different. The physical distance between the nodes of interest and the ratio between the horizontal and vertical resistances k are included in the expression. The maximum error of the closed-form expression, as compared with the exact solution, is less than 5% for a wide range of k. The error further decreases with greater separation between the nodes of interest.

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“…Manuscript received December 21, 2010 The effective resistance of a mesh is used in power grid analysis [5], [6], substrate analysis [7], decoupling capacitance allocation [8]- [11], power dissipation [12] and electrostatic discharge (ESD) analysis [12], and measuring resistance variations in power distribution networks [13]. The effective resistance is used to determine the effective region of a decoupling capacitor [8], [14].…”

Section: Introductionmentioning

confidence: 99%