2020
DOI: 10.1103/physrevd.101.031101
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Measuring the impact ionization and charge trapping probabilities in SuperCDMS HVeV phonon sensing detectors

Abstract: A 0.93 gram 1×1×0.4 cm 3 SuperCDMS silicon HVeV detector operated at 30 mK was illuminated by 1.91 eV photons using a room temperature pulsed laser coupled to the cryostat via fiber optic. The detector's response under a variety of specific operating conditions was used to study the detector leakage current, charge trapping and impact ionization in the high-purity Si substrate. The measured probabilities for a charge carrier in the detector to undergo charge trapping (0.713 ± 0.093%) or cause impact ionization… Show more

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Cited by 12 publications
(11 citation statements)
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“…As an example of the systematic effect on measured Fano factor, we consider here the effect of finite charge collection. In this case, the probability of observing n − k final charges given n initial charges is [49,50]…”
Section: Appendix A: Fano Factor Systematicsmentioning
confidence: 99%
See 1 more Smart Citation
“…As an example of the systematic effect on measured Fano factor, we consider here the effect of finite charge collection. In this case, the probability of observing n − k final charges given n initial charges is [49,50]…”
Section: Appendix A: Fano Factor Systematicsmentioning
confidence: 99%
“…Ref. [50]), promise to significantly reduce these systematics, and should be able to produce much more accurate measurements of intrinsic Fano factor. In particular, the recent measurement of Ref.…”
Section: Appendix A: Fano Factor Systematicsmentioning
confidence: 99%
“…The fill-in between the laser peaks can be explained via both charge trapping and impact ionization as charges propagate across the crystal [34]. In the former case, a charge is trapped in the crystal lattice, reducing the amount of phonon energy produced by shortening the drift length through the crystal.…”
Section: A Small Signal Responsementioning
confidence: 99%
“…The charge trapping and impact ionization probabilities were evaluated for this detector by fitting the laser data with the model described in Ref. [34]. From these fits, we obtain a charge trapping of 12.7% and an impact ionization of 0.6% with the data acquired at TUNL.…”
Section: A Small Signal Responsementioning
confidence: 99%
“…With the advent of the single-charge sensitive HVeVs, a number of interesting microscopic detector phenomena are able to be studied in new ways. For example, the distribution of events with energy between e/h peaks ("non-quantized" events) allows measurement of impact ionization and trapping probabilities [243]. The ability to differentiate quantized and non-quantized events has also allowed closer study of possible sources of leakage current when HV is applied.…”
Section: Pulse Burstsmentioning
confidence: 99%