This work confirms
that radical intermediates are the reactive species in quinhydrone/methanol
(QHY/ME) passivation on silicon surfaces. The two constituent parts, p-benzoquinone (BQ) and hydroquinone (HQ), have been studied
separately. BQ abstracts the hydrogen atom from methanol to become
semiquinone radicals (QH*). Both QH* and the resulting methanol radical
are responsible for the large, instantaneous increase in minority
carrier lifetime in BQ/ME, obtaining the lowest surface recombination
velocity of 1.6 cm/s. HQ releases a hydrogen atom to become QH*. The
quinone derivatives containing a lower electronegativity group (Cl
or O) on the benzene ring form radicals more easily, and give
better passivation results. This radical-driven passivation mechanism
is also valid on other radical sources. X-ray photoelectron spectroscopy
(XPS) supports the radical mechanism in the observation of dominating
BQ bonding after 1 h of BQ/ME treatment, and increasing methanol bonding
with increasing immersion time, reaching a roughly 21% SiOSi, 13%
ME, and 6% BQ monolayer coverage in 24 h for BQ/ME passivated silicon.
Density functional theory (DFT) further confirms the thermodynamic
possibility of radical bonding and proves that the “edge-on”
single-bonded configuration is more energetically favorable than the
“face-on” double-bonded configuration.