We compared the temperature dependent spectral variations of the amplified spontaneous emission (ASE) between InGaN/GaN quantum well samples of no doping, well doping, and barrier doping of silicon. The comparisons were particularly made between two series of samples with a low and a high indium content. The results show that a multi-peak ASE spectral feature and a low energy stimulated emission peak, existing at the photoluminescence shoulder, could be observed only in the high-indium-content, barrier-doped sample. Such results are supposed to originate from the formation of quantum dots of various sizes, concentrations, and shapes under the condition of barrier doping in the sample. 1 Introduction Silicon doping in InGaN/GaN quantum wells (QWs) has been widely used in fabricating high performance light emitting devices. With silicon doping, the effects of growth mode change, microstructure alternation (formation of quantum dots (QDs)-like structures), potential fluctuation reduction, strain relaxation, and piezoelectric field screening have been reported [1][2][3][4][5]. However, most previous studies of silicon doping effects focused on the samples emitting purple-blue photons. Usually, it is difficult to achieve a uniform InGaN alloy, particularly with high indium contents. This is because of the solid phase immiscibility and phase separation, which stem from the large lattice constant mismatch between GaN and InN. Because of the need of blue and green light-emitting applications, it becomes more and more important to study high indium InGaN compounds with silicon doping. In this paper, we report the characteristics of amplified spontaneous emission (ASE), photoluminescence (PL), and photoluminescence excitation (PLE) of high indium (in the green range) InGaN/GaN QWs. Also, the results of relatively low-indium-content QWs were compared to show the effects of indium content variation.