Mechanisms for the desorption of large organic molecules

Johnson, R. E.

doi:10.1016/0168-1176(87)87060-x

Cited by 78 publications

(10 citation statements)

References 65 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Copper shows stronger dependence (power of 2.4) than Au, I and Cl ions (power of 1.31), while Si ions have even higher dependence (power of 4). The first two subsets do not show dependence predicted by some of the models (quadratic or fourth power) [4,5,6,9,10].…”

Section: Resultsmentioning

confidence: 83%

Dependence of Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Secondary Molecular Ion Yield from Phthalocyanine Blue on Primary Ion Stopping Power

Brajković

Barac

Radović

et al. 2020

J. Am. Soc. Mass Spectrom.

View full text Add to dashboard Cite

Time-of-flight Secondary Ion Mass Spectrometry (TOF SIMS) is a well-established mass spectrometry technique used for the chemical analysis of both organic and inorganic materials. In the last ten years, many advances have been made to improve the yield of secondary molecular ions, especially those desorbed from the surfaces of organic samples. For that, cluster ion beams with keV energies for the excitation were mostly used. Alternatively, single-ion beams with MeV energies can be applied, as done in the present work. It is well known that secondary molecular/ion yield depends strongly on the primary ion stopping power, but the nature of this dependence is not completely clear. Therefore, in the present work secondary ion yield from the phthalocyanine blue (C 32 H 16 CuN 8 , organic pigment) was measured for the various combinations of ion masses, energies and charge states. Measured values were compared with the existing models for ion sputtering. An increase of the secondary yield with the primary ion energy, electronic stopping, velocity and charge state was found for different types of primary ions. Although this general behavior is valid for all primary ions, there is no single parameter that can describe the measured results for all primary ions at once.

show abstract

Section: Resultsmentioning

confidence: 83%

Dependence of Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Secondary Molecular Ion Yield from Phthalocyanine Blue on Primary Ion Stopping Power

Brajković

Barac

Radović

et al. 2020

J. Am. Soc. Mass Spectrom.

View full text Add to dashboard Cite

show abstract

“…The measured sputtering yield for a given analyte (number of emitted particles per incident one) will be affected as well through the ejection efficiency (pure sputtering effect) and through the effective concentration of the analyte in the sampled volume. Theoretical models of sputtering have been developed for solids and extended to liquids (8)(9)(10).…”

Section: A Sputteringmentioning

confidence: 99%

Liquid matrices for liquid secondary ion mass spectrometry–fast atom bombardment: An update

Pauw

Agnello

Derwa

1991

Mass Spectrometry Reviews

View full text Add to dashboard Cite

“…Theories of ion-induced chemical reactions at the surface of solids have been reviewed by Johnson [1]. Most models describe a system in which an energetic ion penetrates a surface coated with neutral molecules and loses energy along its track.…”

Section: Introductionmentioning

confidence: 99%

Analysis of Ferroelectric Microcapacitors at Low and High Temperatures Using a Scanning Probe Microscope

Kin

Honda

2006

Jpn. J. Appl. Phys.

View full text Add to dashboard Cite

This paper reports experiments in which methyl ions and hydrogen ions are generated and accelerated within a plasma plate array so that they interact with neutral methane molecules on the inside surfaces of a set of microchannels. The impact energies of the ions are in the range 10 eV to greater than 100 eV. The energy delivered in interactions at the surfaces causes the production of larger hydrocarbon molecules such as C 2 H 2 , C 2 H 4 and C 2 H 6 as well as molecules containing C 3 , C 4 , C 5 , C 6 , C 7 and C 8 .

show abstract

Mechanisms for the desorption of large organic molecules

Cited by 78 publications

References 65 publications

Dependence of Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Secondary Molecular Ion Yield from Phthalocyanine Blue on Primary Ion Stopping Power

Dependence of Megaelectron Volt Time-of-Flight Secondary Ion Mass Spectrometry Secondary Molecular Ion Yield from Phthalocyanine Blue on Primary Ion Stopping Power

Liquid matrices for liquid secondary ion mass spectrometry–fast atom bombardment: An update

Analysis of Ferroelectric Microcapacitors at Low and High Temperatures Using a Scanning Probe Microscope

Contact Info

Product

Resources

About