2015
DOI: 10.1016/j.matlet.2015.08.067
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Mechanistic study on highly crystalline (002) plane bounded ZnO nanofilms prepared via direct current magnetron sputtering

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Cited by 16 publications
(2 citation statements)
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“…Generally, deviations in peak magnitudes can be attributed to scattering pattern differences of crystal mechanisms, shifts in the lattice orientation or to the difference in crystallite size. Likewise, the heights of main peak for high deposition pressure altered following the plots reported in other works [28]. XRD diffraction peaks at 2θ = 23.9 • , 39.5 • , 46.62 • and 56.9 • are well-indexed with the JCPDS Card No.…”
Section: Resultsmentioning
confidence: 55%
“…Generally, deviations in peak magnitudes can be attributed to scattering pattern differences of crystal mechanisms, shifts in the lattice orientation or to the difference in crystallite size. Likewise, the heights of main peak for high deposition pressure altered following the plots reported in other works [28]. XRD diffraction peaks at 2θ = 23.9 • , 39.5 • , 46.62 • and 56.9 • are well-indexed with the JCPDS Card No.…”
Section: Resultsmentioning
confidence: 55%
“…As reported in the literature, the ZnO thin films have been prepared by various techniques, such as sol-gel [6] , Chemical Vapor Deposition (CVD) [7,8] , Molecular Beam Epitaxy (MBE) [9,10] , Pulsed Laser Deposition (PLD) [11] and Magnetron Sputtering (MS) [12][13][14][15][16][17][18][19][20] . Regardless of sample preparation, the MS technique is believed to be one of the most efficient methods because of the high product ability and the easily controllable.…”
Section: Introductionmentioning
confidence: 99%