In this work, it is proved that GaN high‐electron‐mobility transistors (HEMTs) containing deep‐level traps obey the two fundamental memristive criteria. Furthermore, it is demonstrated, based on isothermal measurement data, that the possible set of state variables responsible for the observed memristivity in GaN HEMTs should include an additional variable that is not the temperature. Using a theoretical model, based on the Shockley‐Read‐Hall statistics, a deep‐level trapping‐related variable is suggested as the most probable hidden state variable.