2017
DOI: 10.1021/acsomega.7b01167
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Memristors Using Solution-Based IGZO Nanoparticles

Abstract: Solution-based indium–gallium–zinc oxide (IGZO) nanoparticles deposited by spin coating have been investigated as a resistive switching layer in metal–insulator–metal structures for nonvolatile memory applications. Optimized devices show a bipolar resistive switching behavior, low programming voltages of ±1 V, on/off ratios higher than 10, high endurance, and a retention time of up to 10 4 s. The better performing devices were achieved with annealing temperatures of 200 °C and using asym… Show more

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Cited by 43 publications
(35 citation statements)
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“…In terms of currents, the LRS was more reproducible than the HRS, Figure 2c, whereas the reset voltage showed a narrower distribution compared to the set voltages, Figure 2d. [32] The filamentary nature of the switching when the set was done in the reverse direction of the diode was confirmed by the unipolar characteristics given in Figure 3. [32] The filamentary nature of the switching when the set was done in the reverse direction of the diode was confirmed by the unipolar characteristics given in Figure 3.…”
Section: Resultsmentioning
confidence: 73%
See 1 more Smart Citation
“…In terms of currents, the LRS was more reproducible than the HRS, Figure 2c, whereas the reset voltage showed a narrower distribution compared to the set voltages, Figure 2d. [32] The filamentary nature of the switching when the set was done in the reverse direction of the diode was confirmed by the unipolar characteristics given in Figure 3. [32] The filamentary nature of the switching when the set was done in the reverse direction of the diode was confirmed by the unipolar characteristics given in Figure 3.…”
Section: Resultsmentioning
confidence: 73%
“…The reset current level scaled gradually with the set voltage range. [32] The absence of the oxygen-deficient Adv. The device initiation is also possible using current sweeps ( Figure S2c, Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
“…18 a) schematic illustration of a memristor device and b) representative IV characteristics for the memristor set and reset processes. Reproduced from Rosa et al 381 Memristors have also been considered as a route to achieve stable data storage, as demonstrated by Rosa et al 381 with solution processed a-IGZO, figure 18. Here conducting filaments were induced in the a-IGZO material during the writing phase, which were then disrupted during the reset phase.…”
Section: Data Storagementioning
confidence: 99%
“…The RS performance of these memories could be enhanced since the conical electrode concentrated the electric field at the sharp tip to localize the forming site of the conductive filament to tens of nanometers. Rosa et al introduced indium–gallium–zinc oxide nanoparticle (IGZOnp)‐based memristive device using solution process . The solution‐based deposition provides more defective film with low cost compared to a film deposited by vacuum process, which can be promising for the fabrication of RS memory.…”
Section: Inorganic Resistive Switching Memoriesmentioning
confidence: 99%