MEMS solar sensor testing for satellite applications

Ortega, Juan-Antonio; Tarrida, C. L.; Quero, J.M.; Delgado, Francisco; Ortega, Pablo; Castañer, Luís; Reina, M.; Angulo, M.; Morilla, Yolanda; López, J. Garcı́a

doi:10.1109/sced.2009.4800503

Cited by 10 publications

(8 citation statements)

References 6 publications

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“…Testing this category of devices has many challenges 6 Journal of Sensors due to complex sensing functionality and a variety of designs. The test mechanism developed for theses sensors also has issues of fault detection as reported in [86][87][88], because each device required individual test bench to analyze the sensing environment. As these tools and testing techniques have been leveraged from the IC technology, therefore, these were helpful in resolving various fault mechanisms to an extent.…”

Section: Issues In Device Level Testingmentioning

confidence: 99%

A Review on Key Issues and Challenges in Devices Level MEMS Testing

et al. 2016

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The present review provides information relevant to issues and challenges in MEMS testing techniques that are implemented to analyze the microelectromechanical systems (MEMS) behavior for specific application and operating conditions. MEMS devices are more complex and extremely diverse due to the immersion of multidomains. Their failure modes are distinctive under different circumstances. Therefore, testing of these systems at device level as well as at mass production level, that is, parallel testing, is becoming very challenging as compared to the IC test, because MEMS respond to electrical, physical, chemical, and optical stimuli. Currently, test systems developed for MEMS devices have to be customized due to their nondeterministic behavior and complexity. The accurate measurement of test systems for MEMS is difficult to quantify in the production phase. The complexity of the device to be tested required maturity in the test technique which increases the cost of test development; this practice is directly imposed on the device cost. This factor causes a delay in time-to-market.

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Section: Issues In Device Level Testingmentioning

confidence: 99%

A Review on Key Issues and Challenges in Devices Level MEMS Testing

et al. 2016

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“…The technology in μFineSunSensor is the same used in Vectorsol, which has been already tested and approved for satellite integration [8] [9]. By calibrating the sensor with spatial radiation (AM0), the device will be ready for being used in satellite applications.…”

Section: B Satellite Applicationsmentioning

confidence: 99%

“…1) for satellite application with a 0.15º accuracy and a ±60º field of view (FOV). The resulting device has been boarded in the Spanish nano satellite NANOSAT-1B, which was launched in July 2009 and it has been working at expected performance since then [8] [9]. Fig.…”

Section: Introductionmentioning

confidence: 99%

Accurate and Wide-Field-of-View MEMS-Based Sun Sensor for Industrial Applications

Delgado

Quero

García

et al. 2012

IEEE Trans. Ind. Electron.

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-This paper shows the design, fabrication, simulation results and experimental results of an improved miniaturized two-axis sun sensor for industrial applications, by adapting the technology used previously in satellite applications. The sensor for each axis is made of six photodiodes integrated in a crystalline silicon substrate, and a layer of cover glass, which is used to protect the silicon and to hold the windows. The high precision will be obtained by the subdivision of field of view (FOV), which is ±60º, with a resolution of 0.1º. Each region will be controlled by an independent high precision solar sensor. The sensor can be used for sun tracking applications in photovoltaic system, heliostat concentration and lighting purposes.

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“…Sensors have been subjected to a set of qualification tests in order to guarantee the necessary life-cycle of NANOSAT-1B mission (see [20] for details). Outgassing, thermal, vibration, EMI and impact tests of sun sensors have been carried out using INTA facilities.…”

Section: B Flight Qualification Testsmentioning

confidence: 99%

A Miniaturized Two Axis Sun Sensor for Attitude Control of Nano-Satellites

et al. 2010

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Abstract-This paper describes the design, fabrication, characterization, and satellite integration of a miniaturized two axis sun sensor which has been used in the attitude control system of the Spanish nano-satellite NANOSAT-1B. This device is made of four silicon photodiodes monolithically integrated in a crystalline silicon substrate, protected by a transparent cover glass assembled on the same silicon die against space radiation damage. The sensor fabrication combines standard silicon processing technology with a high performance solar cell fabrication process. The sensor, including electronics and mechanical and electrical interfacing with the satellite, has a small size (3 cm 3 cm) and low weight (24 gr.), with a sun field-of-view greater than 60 with an angle accuracy better than 0.15 . Three of these sensors have already been integrated in the NANOSAT-1B platform that has been successfully launched in July 2009. Index Terms-Angle measurement, cover glass, field-of-view (FOV), satellite attitude control, silicon photodiodes, sun sensor.

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MEMS solar sensor testing for satellite applications

Cited by 10 publications

References 6 publications

A Review on Key Issues and Challenges in Devices Level MEMS Testing

A Review on Key Issues and Challenges in Devices Level MEMS Testing

Accurate and Wide-Field-of-View MEMS-Based Sun Sensor for Industrial Applications

A Miniaturized Two Axis Sun Sensor for Attitude Control of Nano-Satellites

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