2002
DOI: 10.1016/s0040-6090(02)00446-7
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Metal–organic chemical vapour deposition of thin films of cobalt on different substrates: study of microstructure

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Cited by 24 publications
(14 citation statements)
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“…Electrocatalyst Films thickness was estimated by cross-sectional SEM (micrographs not shown) and was about 180-250 nm, in accordance with other films reported elsewhere [24,25]. Fig.…”
Section: Xrd Sem and Tem Analysissupporting
confidence: 85%
See 1 more Smart Citation
“…Electrocatalyst Films thickness was estimated by cross-sectional SEM (micrographs not shown) and was about 180-250 nm, in accordance with other films reported elsewhere [24,25]. Fig.…”
Section: Xrd Sem and Tem Analysissupporting
confidence: 85%
“…The films oxygen content (as confirmed later by EDAX) is due to the fact that film top surface is oxidized by air. Oxygen content can vary through film thickness [24,25]. Fig.…”
Section: Xrd Sem and Tem Analysismentioning
confidence: 99%
“…7 In depositing Co or bimetallic Co based films by means of MOCVD, one should use Co compounds whose structure does not include cobalt-oxygen bonds in order to avoid cobalt oxide formation. Several cobalt compounds with Co-C bonds, namely, Co 2 (CO) 8 , Co(C 5 H 5 ) 2 and their derivatives C 5 H 5 Co(CO) 2 , Co(CO) 3 NO and [Co 2 (CO) 6 (g 2 -Me 3 SiCCH)], were adopted as MOCVD precursors for Co film deposition. However, these compounds have some disadvantages that limiting their application: undesired reactions in the gas phase and low thermal stability in the condensed phase.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, antibacterial coatings with thin cobalt films [8] or the application as catalyst nanoparticles for the growth of carbon nanotubes [9] are of interest. Such thin films are generated using different techniques including sputtering [10], electron beam evaporation [11,12], ALD (Atomic Layer Deposition) [13][14][15][16][17][18][19] and (MO)CVD (metal-organic chemical vapor deposition) [20][21][22][23]. Within the latter deposition technique, it could be shown that this process is capable of forming uniform cobalt films in a highly controlled manner .…”
Section: Introductionmentioning
confidence: 99%