Metallized polymer film capacitors ageing law based on capacitance degradation

Makdessi, Maawad; Sarı, Ali; Venet, Pascal

doi:10.1016/j.microrel.2014.07.103

Cited by 93 publications

(44 citation statements)

References 12 publications

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“…Furthermore, Makdessi et al demonstrated that the aging rate of metallized polymer film capacitors could be described by (9) and (11), and model simulations fit the experiment well [43]. Fig.…”

Section: Calendar Aging Identification Resultsmentioning

confidence: 88%

Lithium battery aging model based on Dakin’s degradation approach

Baghdadi

Briat

Delétage

et al. 2016

Journal of Power Sources

175

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Section: Calendar Aging Identification Resultsmentioning

confidence: 88%

Lithium battery aging model based on Dakin’s degradation approach

Baghdadi

Briat

Delétage

et al. 2016

Journal of Power Sources

175

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“…Makdessi et al [42] investigate accelerated aging tests at different temperatures and voltage stresses for metallized film capacitors. The self-healing process is assumed to be a non-homogeneous phenomenon that follows an exponential probabilistic law.…”

Section: Degradation Modeling 31 Metallized Film Capacitorsmentioning

confidence: 99%

A Review of Degradation Behavior and Modeling of Capacitors

Gupta

Yadav

DeVoto

et al. 2018

ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystem

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This paper firstly reviews the failure causes, modes and mechanisms of two major types of capacitors used in power electronic systems — metallized film capacitors and electrolytic capacitors. The degradation modeling related to these capacitors is then presented. Both physics-of-failure and data-driven degradation models for reliability and lifetime estimation are discussed. Based on the exhaustive literature review on degradation modeling of capacitors, we provide a critical assessment and future research directions.

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“…Separated and/or combined effects of such constraints can have serious consequences on different parts of the component and cause its failure. According to previous work [16], [17] it was noted that most of the encountered failure mode of MPF capacitors during their lifetime can be monitored by ESR and C evolution.…”

Section: Metallized Polymer Film Capacitors Failure Mechanismsmentioning

confidence: 99%