Rare-earth perovskite nickelates RNiO 3 (R stands for Y, rare earths, Tl or Bi) have attracted wide attention in the past few decades because of their unique electronic properties that emerge from the insulator−metal transition (IMT). This transition can be tuned by chemical substitutions or by external variables, like pressure and temperature, but the mechanism of this transition still remains debated. While most previous studies focused on nickelates with partially filled 4f cations on the R site, here we studied the mechanism of the pressure-induced phase transition on a rare Tl 3+ nickelate, which comprises fully filled 4f orbitals. We probed the pressure-induced structural and electronic changes taking place at the bulk, medium, and local atomic level at room temperature by using synchrotron X-ray diffraction (XRD), X-ray absorption near edge structure (XANES), and extended X-ray absorption fine structure (EXAFS) as probing techniques, respectively. High-resolution XRD data under ambient conditions show evidence for the monoclinic phase of TlNiO 3 , as characterized by the charge ordering between Ni 3−δ and Ni 3+δ in the insulator regime. High-pressure XRD data elucidated an anomaly in the evolution of the lattice parameters at 10.8 GPa, which we assigned to the structural transition P2 1 /n → Pbnm. High-pressure EXAFS data at the Ni K-edge provide a solid proof for a short-order charge disproportionation under near ambient conditions. The Ni−O pair-bond compression curves unveiled an isotropic overlapping Ni t 2g 6 e g 1 → O 2p, with an anomaly at 10.8 GPa. The pressure evolution of the bond-distance variance (Debye−Waller exponents) lodged a hardening at this pressure point, suggesting constrained atomic displacements in the average range of ±0.04(5) Å. We propose that this reduced motional freedom could be linked to an electron−phonon coupling, which is the driving force behind the mechanisms of the IMT. We demonstrated that the XANES technique can be applied to ascertain the pressure-induced transition, by tracking the anomalous behavior of the position and width (full width at half-maximum) of the XANES features.