2018
DOI: 10.1002/crat.201700157
|View full text |Cite
|
Sign up to set email alerts
|

Method for Determining Crystal Grain Size by X‐Ray Diffraction

Abstract: The crystal grain size can be quantitatively calculated by Scherrer equation according to the diffraction peak broadening in the XRD curves. Actually, the results calculated by the Scherrer equation are the thickness that perpendicular to the crystal planes. However, in the actual XRD measurements, the broadening of the diffraction peaks is not only because of the Micro‐level changes of crystal such as grain size and lattice distortion, but also due to the instrumental broadening. Thus, the Scherrer equation i… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

7
94
0
5

Year Published

2019
2019
2024
2024

Publication Types

Select...
8
1

Relationship

0
9

Authors

Journals

citations
Cited by 277 publications
(106 citation statements)
references
References 4 publications
7
94
0
5
Order By: Relevance
“…X-ray was generated at 40 mA and 40 kV and the scanning position ranged from 20–140° 2(θ). The crystal grain sizes were calculated using the Scherrer equation [ 46 ].…”
Section: Methodsmentioning
confidence: 99%
“…X-ray was generated at 40 mA and 40 kV and the scanning position ranged from 20–140° 2(θ). The crystal grain sizes were calculated using the Scherrer equation [ 46 ].…”
Section: Methodsmentioning
confidence: 99%
“…where χ (%) is crystallinity percentage, is the area of the amorphous halo, is the area of the main crystallization peak at 2 = 21.22°, and is the area of the secondary crystallization peak at 2 = 23.63°. In addition, the grain size of the different diffraction peaks corresponding to different crystal lamellar can be calculated by Scherrer equation [31]. The calculating formula is as follows:…”
Section: Results Of Xrd Measurementmentioning
confidence: 99%
“…Status of the current crystal structure of the specimens after thermal effects. In addition, the grain size of the different diffraction peaks corresponding to different crystal lamellar can be calculated by Scherrer equation [31]. The calculating formula is as follows:…”
Section: Results Of Xrd Measurementmentioning
confidence: 99%
“…Moreover, their narrow full widths at half maximum (FWHM) and strong intensities are indicative of excellent crystallinity [19]. The values of FWHM can be further utilized to calculate the average grain sizes through the Scherrer equation [20], by which both sizes for the DAST single crystals grown with and without the OA control were estimated to be similarly about 90 nm. It should be noted that the peak intensities of the DAST grown under the control of the OA at (002), (004), (006), and (008) face are 3.45, 1.76, 2.03, and 2.28 times greater than those of the DAST grown without the OA control, respectively (Figure 4).…”
Section: Resultsmentioning
confidence: 99%