2012 35th International Spring Seminar on Electronics Technology 2012
DOI: 10.1109/isse.2012.6273116
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Method for in-situ power LEDs' junction temperature measurements

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Cited by 7 publications
(3 citation statements)
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“…This well-known method presupposes the almost linear dependence between forward voltage drop and junction temperature in a distinct range of operating conditions [5][6][7]. Our previous investigations show that the proposed procedure is suitable for the discussed application, provides reliable in-situ results, and does not require expensive equipment.…”
Section: Problem and Motivationmentioning
confidence: 91%
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“…This well-known method presupposes the almost linear dependence between forward voltage drop and junction temperature in a distinct range of operating conditions [5][6][7]. Our previous investigations show that the proposed procedure is suitable for the discussed application, provides reliable in-situ results, and does not require expensive equipment.…”
Section: Problem and Motivationmentioning
confidence: 91%
“…However, experiments show that it is necessary to assess the forward voltage drop of every LED array in order to obtain P th,array sufficiently accurate. The used measurement equipment should have an accuracy of at least 0.1% for measuring I F and U F [7]. …”
Section: Problem and Motivationmentioning
confidence: 99%
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