2012
DOI: 10.1063/1.4757985
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Method for investigating threshold field of charge injection at electrode/dielectric interfaces by space charge observation

Abstract: We propose a dielectric sample model to investigate the threshold field for charge injection at electrode/dielectric interfaces by space charge observation. The model sample consists of a dielectric layer and two thin charge blocking layers, respectively, placed at the inside and one side of the dielectric layer. The method has been applied to investigate the threshold field for charge injection from Al, Au, or semiconductive electrode into polyethylene. Experimental results show that charge injection occurs s… Show more

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Cited by 10 publications
(18 citation statements)
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“…In addition, if the metal-induced gap states also truly exist in metal/dielectric interfaces, electrons would be transferred at a very low field by a thermal assistance from occupied metal-induced gap states to localized states of the dielectric and the Schottky emission would no longer be a required process for the electron transfer. This has been confirmed by other authors'results [7], also by our recent results on the basis of direct observation of space charge, where charge injection at the semicon, Au, or Al electrode/polyethylene (PE) interface occurred at the temperature of 40 °C so long as the interface electric field was nonzero [9].…”
Section: Introductionsupporting
confidence: 66%
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“…In addition, if the metal-induced gap states also truly exist in metal/dielectric interfaces, electrons would be transferred at a very low field by a thermal assistance from occupied metal-induced gap states to localized states of the dielectric and the Schottky emission would no longer be a required process for the electron transfer. This has been confirmed by other authors'results [7], also by our recent results on the basis of direct observation of space charge, where charge injection at the semicon, Au, or Al electrode/polyethylene (PE) interface occurred at the temperature of 40 °C so long as the interface electric field was nonzero [9].…”
Section: Introductionsupporting
confidence: 66%
“…In this work, to determine whether the charge injection is a thermal assistance process, we further investigate the charge injection at the electrode/PE interfaces at 20 °C and 60 °C, and compare the results with the previous results in the recent publication [9].…”
Section: Introductionmentioning
confidence: 91%
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“…4 Their sample consists of two dielectric layers and two thin charge blocking layers (fluorinated polyethylene), placed in alternative between the two electrodes. The blocking layers are able to block charge movement, leading to charge accumulation at the interface.…”
Section: And Lisheng Zhongmentioning
confidence: 99%