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We propose a dielectric sample model to investigate the threshold field for charge injection at electrode/dielectric interfaces by space charge observation. The model sample consists of a dielectric layer and two thin charge blocking layers, respectively, placed at the inside and one side of the dielectric layer. The method has been applied to investigate the threshold field for charge injection from Al, Au, or semiconductive electrode into polyethylene. Experimental results show that charge injection occurs so long as the interface electric field is nonzero, i.e., there is no indication of a threshold field for the charge injection.

Cellular polypropylene (PP) films were fluorinated under a high pressure of 13 bar of the F2/N2 mixture and were post-treated by nitrous oxide and isothermal crystallization. The fluorinated and post-treated PP films after being expanded and corona charged exhibit a significantly improved piezoelectric thermal stability. After annealing at 70 °C for 151 h or at 90 °C for 224 h, the piezoelectric d33 value of the fluorinated and post-treated piezoelectric sample still retains 58% or 45% of its initial d33 value, while the corresponding value of the virgin piezoelectric sample has decreased to 29% or 15% of the initial value. Chemical composition analysis of the cross section of the fluorinated and post-treated film by energy-dispersive x-ray spectroscopy indicates that the internal layers have been fluorinated, in spite of a lower degree of fluorination compared with the fluorinated surface layer. Short-circuit and open-circuit TSD current measurements reveal that the fluorinated internal layers, like the fluorinated surface layer, also have very deep charge traps, although there probably is a difference in density of the deep traps between them. The deeply trapped charge on the internal layers of the fluorinated and post-treated piezoelectric sample is responsible for its significantly improved piezoelectric thermal stability.

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In order to suppress surface charge accumulation on the epoxy resin insulation and to investigate the influence of treatment time on the charge accumulation, epoxy samples are surface fluorinated for the different times of 10 min, 30 min and 60 min in a laboratory vessel using an F2/N2 mixture. Attenuated total reflection infrared analyses and the observations of the cross section and the surface of the samples by SEM indicate the increases in degree of fluorination, thickness and compactness of the fluorinated layer, and the decrease in surface roughness, with treatment time increasing. Compared with the deep surface charge traps and stable surface charge of the unfluorinated (original) sample, as indicated by the open-circuit thermally stimulated discharge current measurement, the fluorinated surface cannot store the charge. The corona charges deposited on the sample surfaces fluorinated for 10 min, 30 min or 60 min rapidly decay to zero in about 2 min, 10 min or 15 mi at room temperature respectively, showing a slowed-down release of charge with fluorination time. The measurements of surface conductivity and contact angle and the calculation of surface energy reveal that fluorination gives rise to dramatic increases in surface conductivity, surface wettability and polarity, while they decrease with treatment time. The significant increase in surface conductivity of the fluorinated sample is attributed to a very likely substantial decrease in trap depth and the adsorbed water on the fluorinated surfac. Surface charging current measurements further show that large steady state current flows along the fluorinated surface during corona charging, in comparison with the almost zero steady state current for the original sample. This implies that the fluorinated sample has much lower surface charge accumulation in the period of charging, than the original sample.