Method for lower computation of testability analysis for analog circuit

Abstract

A efficient approach to simplify the process of linearly combination matrix of testability matrix is presented to efficiently partition ambiguity group and canonical ambiguity group in low-testability analog circuits. The approach presented uses only a single QR factorization technique and fewer matrix computations applied to the testability matrix. Then testable components and all ambiguity groups and canonical ambiguity group can be obtained from equivalent binary matrix that has the same size as linear combination matrix. At last an experiment of Band-pass Filter Circuit is presented to demonstrate the effectives of the proposed algorithm.