Method of mechanical holding of cantilever chip for tip-scan high-speed atomic force microscope

Abstract

Articles you may be interested in Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid Rev. Sci. Instrum. 85, 126106 (2014) In tip-scan atomic force microscopy (AFM) that scans a cantilever chip in the three dimensions, the chip body is held on the Z-scanner with a holder. However, this holding is not easy for high-speed (HS) AFM because the holder that should have a small mass has to be able to clamp the cantilever chip firmly without deteriorating the Z-scanner's fast performance, and because repeated exchange of cantilever chips should not damage the Z-scanner. This is one of the reasons that tip-scan HS-AFM has not been established, despite its advantages over sample stage-scan HS-AFM. Here, we present a novel method of cantilever chip holding which meets all conditions required for tip-scan HS-AFM. The superior performance of this novel chip holding mechanism is demonstrated by imaging of the α 3 β 3 subcomplex of F 1 -ATPase in dynamic action at ∼7 frames/s. C 2015 AIP Publishing LLC. [http://dx

High-speed atomic force microscopy for materials science

“…Although capable of imaging in high-speed contact mode Ando's HS-AFMs are best known for the observation of biological events in real time using intermittent contact mode. Every aspect of Ando's HS-AFM was optimised 66,[96][97][98][99] to achieve the greatest possible imaging rate while keeping the probe-…”

“…Although capable of imaging in high-speed contact mode Ando’s HS-AFMs are best known for the observation of biological events in real time using intermittent contact mode. Every aspect of Ando’s HS-AFM was optimised 66,96–99 to achieve the greatest possible imaging rate while keeping the probe–sample interaction forces at the extremely low levels required to image these delicate biological systems successfully and without damaging them. Figure 3 shows select frames from a video collected using the Kanazawa intermittent contact HS-AFM.

Figure 3 Selected frames form Kodera et al 102 showing the motion of a single myosin 5 molecule ‘walking’ along an actin filament.

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Error Analysis of the Combined-Scan High-Speed Atomic Force Microscopy

“…In tip-scan and combined-scan AFM, the cantilever probe moves with the scanners, and there is mutual movement between the cantilever and the incident laser. Thus, the laser tracking error must be considered in the tip-scan and combined-scan AFM designing [ 13 , 14 , 15 ]. One of the causes of the laser tracking error is the nonorthogonality of the three scanners.…”