Method to calculate electric fields at very small tip-sample distances in atomic force microscopy

Sacha, G. M.

doi:10.1063/1.3467676

Cited by 9 publications

(8 citation statements)

References 20 publications

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“…The enhanced electric field E z at a location of 40 nm from the tip of the nanospike is about 1.1 × 10 5 V/m when the bias voltage is 9.1 V. This result is also compatible with results obtained from previous experimental and theoretical calculations [21][22][23][24][25][26]. The potential energy of a polar molecule in the electric field is:…”

Section: B Sensing At Low Temperaturesupporting

confidence: 90%

The electric field effect on the sensitivity of tin oxide gas sensors on nanostructured substrates at low temperature

Ren

Huo

Wang

et al. 2014

International Journal of Smart and Nano Materials

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A novel low-temperature SnO 2 gas sensor was prepared and studied on silicon nanostructures formed by femtosecond laser irradiation. By applying a bias voltage on the silicon substrate to alter the charge distribution on the surface of the SnO 2 , carbon monoxide (CO), and ammonia (NH 3 ) gas can be distinguished by the same sensor at room temperature. The experimental results are explained with a mechanism that the sensor works at low temperature because of adsorption of gas molecules that trap electrons to the surface of the SnO 2 .

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Section: B Sensing At Low Temperaturesupporting

confidence: 90%

The electric field effect on the sensitivity of tin oxide gas sensors on nanostructured substrates at low temperature

Ren

Huo

Wang

et al. 2014

International Journal of Smart and Nano Materials

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“…Conversely, when these are present, the spectroscopic curves become weakly influenced by SRE components, which fully agrees with the pioneer work by Terris et al 57 . In this case, any attempt to accurately fit ∆f (V b ) experimental data requires a precise calculation of the electric field within the capacitor 40,80,81 , and therefore a precise knowledge of its geometry.…”

Section: Analytical Results and Comparison With Experimental Resmentioning

confidence: 99%

Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms

2011

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We discuss the influence of short-range electrostatic forces, so called dipolar forces, between the tip of an atomic force microscope (AFM) and a surface carrying charged adatoms. Dipolar forces are of microscopic character and have their origin in the polarizability of the foremost atoms on tip and surface. In most experiments performed by non-contact AFM, other forces such as binding forces dominate the interaction. However, in the experiments presented by Gross et al. [Science 324, 1428[Science 324, (2009, where the charge state of individual gold atoms adsorbed on a thin dielectric layer was determined, binding forces are negligible as the tip-sample distance is relatively large.We develop a model which mimics the experimental tip-sample geometry of the aforementioned experiments. The model includes van der Waals and long-range electrostatic interactions, as well as the short-range electrostatic interaction based on the self-consistent description of electronic polarization effects on neutral and charged adatoms. The model is based on a calculation of the electrostatic energy of the tip-sample geometry.Our calculations of non-contact AFM imaging as well as of bias spectroscopic curves are in good agreement with the experimental ones presented by Gross et al. It is demonstrated that the short-range dipolar force is mainly responsible for the contrast observed in topography imaging above charged species. However, it is the long-range capacitive force which is responsible for the detection of the charge state in bias spectroscopy. We discuss implications of our findings on future experiments which aim to detect single charges by means of Kelvin probe force microscopy.

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“…Moreover, an algorithm called the generalized image charge method (GICM) [17] has also been developed and widely used. It has been applied to evaluate electrostatic interaction between the tip and metallic nanowire over the surface by using the Green's function of the segment [18], and to calculate the electric field at very small tip-sample distances [19]. Nevertheless, the models used in these papers are two-dimensional (2-D) symmetric, and have not proven to be applicable when the sample under test is 3-D.…”

Section: Introductionmentioning

confidence: 99%

Quantitative Theory for Probe-Sample Interaction With Inhomogeneous Perturbation in Near-Field Scanning Microwave Microscopy

Wei

Cui²,

Yue³

et al. 2016

IEEE Trans. Microwave Theory Techn.

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A general approach for calculating tip-sample capacitance variation in near-field scanning microwave microscopy is presented. It can be applied to arbitrary tip shapes, thick and thin films, and variation due to inhomogeneous perturbation. The computation domain for the tip-sample interaction problem is reduced to a block perturbation area by applying Green's theorem, and thus it can save substantial time and memory during calculating either electric field or contrast capacitance for three-dimensional models of near-field microwave microscopy. We show that this method can accurately calculate capacitance variation due to inhomogeneous perturbation in insulating or conductive samples, as verified by finite-element analysis results of commercial software and experimental data from microwave impedance microscopy. More importantly, the method in this paper also provides a rigorous framework to solve the inverse problem, which has great potential to improve resolution by deconvolution.Index Terms-Inhomogeneous perturbation, microwave impedance microscopy (MIM), near-field scanning microwave microscopy (NSMM), tip-sample interaction.

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Method to calculate electric fields at very small tip-sample distances in atomic force microscopy

Cited by 9 publications

References 20 publications

The electric field effect on the sensitivity of tin oxide gas sensors on nanostructured substrates at low temperature

The electric field effect on the sensitivity of tin oxide gas sensors on nanostructured substrates at low temperature

Polarization effects in noncontact atomic force microscopy: A key to model the tip-sample interaction above charged adatoms

Quantitative Theory for Probe-Sample Interaction With Inhomogeneous Perturbation in Near-Field Scanning Microwave Microscopy

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