2019
DOI: 10.1049/iet-smt.2018.5486
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Method to improve the repeatability of dynamic contact resistance measurement test results for high‐voltage circuit breakers

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Cited by 5 publications
(1 citation statement)
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“…It is concluded that the contact resistance is related to the electromagnetic force. Y. Fukuyama et al [10] evaluated how the contact structure affects shrinkage resistance through nanofabricated physical simulation samples, while T. Cheng et al [11] analyzed the mechanism of dynamic contact resistance measurement (DRM) test results by analyzing the chemical composition of the contact surface, the force exerted on the contact and the temperature at point a on the contact surface. S. Sudipta et al [12] designed, developed and demonstrated a tabletop experimental setup for contact resistance and discussed measurements during indentation.…”
Section: Literature Survey and Gapsmentioning
confidence: 99%
“…It is concluded that the contact resistance is related to the electromagnetic force. Y. Fukuyama et al [10] evaluated how the contact structure affects shrinkage resistance through nanofabricated physical simulation samples, while T. Cheng et al [11] analyzed the mechanism of dynamic contact resistance measurement (DRM) test results by analyzing the chemical composition of the contact surface, the force exerted on the contact and the temperature at point a on the contact surface. S. Sudipta et al [12] designed, developed and demonstrated a tabletop experimental setup for contact resistance and discussed measurements during indentation.…”
Section: Literature Survey and Gapsmentioning
confidence: 99%