2019
DOI: 10.1109/tns.2018.2886242
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Methodology for Identifying Radiation Effects in Robotic Systems With Mechanical and Control Performance Variations

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Cited by 2 publications
(4 citation statements)
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“…Metal-oxide semiconductors (MOS) have electronic properties altered (Ma and Dressendorfer, 1989), elastomer materials used in seals can become embrittled (Wündrich, 1984), and optical components have been known to change their transparency and refractive indices over time (Brichard et al, 2001). Changes in the magnitude of measured errors in motor control were observed by Howard et al (2018). Given enough radiation, these changes in mechanical, optical, or electronic properties can ultimately cause failure in susceptible components, potentially causing the robot to break down.…”
Section: Methodology For Performance Assessment Of Industrial Robotsmentioning
confidence: 99%
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“…Metal-oxide semiconductors (MOS) have electronic properties altered (Ma and Dressendorfer, 1989), elastomer materials used in seals can become embrittled (Wündrich, 1984), and optical components have been known to change their transparency and refractive indices over time (Brichard et al, 2001). Changes in the magnitude of measured errors in motor control were observed by Howard et al (2018). Given enough radiation, these changes in mechanical, optical, or electronic properties can ultimately cause failure in susceptible components, potentially causing the robot to break down.…”
Section: Methodology For Performance Assessment Of Industrial Robotsmentioning
confidence: 99%
“…Step 1. Due to high complexity of off-the-shelf industrial robots, it is often very hard to establish analytical models of the systems which may be influenced by radiation (Howard et al, 2018 ). However, it is possible to identify the components which are least radiation tolerant and estimate their failure dose through individual component irradiation testing.…”
Section: Methodology For Performance Assessment Of Industrial Robomentioning
confidence: 99%
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“…The exposed radiation source can be broadly categorized into two categories mainly: 1) ray based and 2) particle based. Extensive researches have highlighted that radiation exposure impinge semiconductor devices [2]- [3]. The focal point of radiation induced degradation measurement has been on custom camera sensors.…”
Section: B Existing Workmentioning
confidence: 99%