2018
DOI: 10.17586/2220-8054-2018-9-4-464-467
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Methodology of analyzing the CdSe semiconductor quantum dots parameters

Abstract: Direct methods (using a laser particle size analyzer) and indirect (from the analysis of spectral characteristics and differential normalized tunnel CVC) methods of CdSe QD size estimation allowed determination of the size (4-5 nm) and shown good qualitative and quantitative agreement of the results with an error of less than 10 %. It is concluded that the tunnel differential CVC analysis is an effective method for express measurement that can be used in quantum-size object investigations.

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Cited by 4 publications
(3 citation statements)
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“…Localized energy levels ε i associated with the properties of a quantum-size object appear in normalized differential tunneling CVCs as individual peaks. To analyze the experimental tunneling I -V characteristics, similarly to the approaches described in [14,15], we used the dependence of (dI/dV )/(I/V ) on the voltage V , since the method of normalized differential CVCs is more informative in experimental data processing. Typical result for investigated samples are shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Localized energy levels ε i associated with the properties of a quantum-size object appear in normalized differential tunneling CVCs as individual peaks. To analyze the experimental tunneling I -V characteristics, similarly to the approaches described in [14,15], we used the dependence of (dI/dV )/(I/V ) on the voltage V , since the method of normalized differential CVCs is more informative in experimental data processing. Typical result for investigated samples are shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Для дополнительного анализа использовался метод нормированных дифференциальных вольт-амперных характеристик I(V ), именно зависимостей (dI/dV )/(I/V ) от напряжения V , подробно описанный и обоснованный в [7].…”
Section: вф кабанов аи михайлов мв гавриковunclassified
“…Для более полного анализа особенностей электрофизических свойств полученных пленочных образцов с КТ, в частности электронного спектра, в настоящей работе использован метод СТМ. Исследования проводились по известным методикам [6].…”
unclassified