Methods for optical phase retardation measurement: A review

Zhang, Peng; Tan, Yidong; Liu, WeiXin; Chen, Wenxue

doi:10.1007/s11431-013-5207-4

Cited by 26 publications

(12 citation statements)

References 39 publications

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“…Since the measurement accuracy and precision of the MMP are better than 0.2% and 0.1% respectively over the whole spectra range [2], the measurement precision for the polarization parameters should be better than 0.05°, which is consistent with the experimental results. The results indicate that the proposed method has an acceptable and comparable precision with those of most of the existing techniques ranging from less than 0.01° to larger than 0.5° [17].…”

Section: Polarization Propertiesmentioning

confidence: 79%

“…Various methods and techniques have been developed to characterize birefringent waveplates as reviewed by Zhang et al [17]. Here, we recall and summarize several typical techniques among numerous excellent works.…”

Section: Introductionmentioning

confidence: 99%

“…Recently, an environment-noise-free optical heterodyne interferometer was proposed to measure the phase retardance of waveplates with immunity to environment instability [23]. Zhang and his team developed a series of laserbased techniques including the laser frequency-splitting method, the laser feedback method, and the polarization flipping method, and they applied these systems to characterize waveplates with very high precision and accuracy [17,[24][25][26]. The polarimetry is another commonly used technique, and different types of polarimeters have been developed to characterize the polarization properties of waveplates [12,[27][28][29][30][31][32].…”

Section: Introductionmentioning

confidence: 99%

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Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry

Chen

Shi

et al. 2018

Opt. Express

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Composite waveplates (CWs) consisting of multiple single waveplates are basic polarization elements and widely used to manipulate the polarized light in optical systems, and their performances affect the final accuracy and precision significantly. This research proposes a method for the comprehensive characterization of an arbitrary CW based on spectroscopic Mueller matrix polarimetry. An analytical model is established to describe a general CW by extending Jones' equivalent theorem with Mueller matrix calculus. In this model, an arbitrary CW is optically equivalent to a cascaded system consisting of a linear retarder with slight diattenuation followed by an optical rotator, and its polarization properties are completely described by four polarization parameters, including the retardance, the fast axis azimuth, the rotation angle, and the diattenuation angle. Analytical relations between the polarization properties, the structure, and the Mueller matrix of the CW are then derived from the established model. By the proposed method, the polarization parameters of an arbitrary CW can be comprehensively characterized over an ultra-wide spectral range via only one measurement. Moreover, the actual structure of the CW, including the thicknesses and fast axis azimuths of the single waveplates, as well as the axis alignment errors, can be completely reconstructed from the polarization spectra. Experiments performed with a house-developed broadband Mueller matrix polarimeter on three typical CWs including a compound zero-order waveplate, an achromatic waveplate and a specially designed biplate have demonstrated the capability of the proposed method.OCIS codes: (120.0120) Instrumentation, measurement, and metrology; (120.2130) Ellipsometry and polarimetry; (230.5440) Polarization-selective devices; (260.5430) Polarization; (120.6200) Spectrometers and spectroscopic instrumentation. with a waveplate in the external cavity," Opt. Lett. 40(15), 3615-3618 (2015). 8. J. L. Vilas and A. Lazarova-Lazarova, "A simple analytical method to obtain achromatic waveplate retarders," J.

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Section: Polarization Propertiesmentioning

confidence: 79%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry

Chen

Shi

et al. 2018

Opt. Express

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“…Then, by controlling the birefringence of the LC molecule electrically, the phase delay of the incident beam is adjusted. However this process needs to be carefully characterized [24][25][26][27] (see Phase Flicker in Section 2.2.1, where one characterization method related to the flicker measurement function is introduced to the reader). The following equation shows how the phase of light is being modulated by a parallel aligned nematic LCoS SLM (GAEA device):…”

Section: Analysis On Lcos For the Wss Systemmentioning

confidence: 99%

LCoS SLM Study and Its Application in Wavelength Selective Switch

et al. 2017

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Abstract:The Liquid-Crystal on Silicon (LCoS) spatial light modulator (SLM) has been used in wavelength selective switch (WSS) systems since the 1990s. However, most of the LCoS devices used for WSS systems have a pixel size larger than 6 µm. Although there are some negative physical effects related to smaller pixel sizes, the benefits of more available ports, larger spatial bandwidth, improved resolution, and the compactness of the whole system make the latest generation LCoS microdisplays highly appealing as the core component in WSS systems. In this review work, three specifications of the WSS system including response time, crosstalk and insertion loss, and optimization directions are discussed. With respect to response time, the achievements of liquid crystal material are briefly surveyed. For the study of crosstalk and insertion loss, related physical effects and their relation to the crosstalk or insertion loss are discussed in detail, preliminary experimental study for these physical effects based on a small pixel LCoS SLM device (GAEA device, provided by Holoeye, 3.74 µm pixel pitch, 10 megapixel resolution, telecom) is first performed, which helps with predicting and optimizing the performance of a WSS system with a small pixel size SLM. In the last part, the trend of LCoS devices for future WSS modules is discussed based on the performance of the GAEA device. Tradeoffs between multiple factors are illustrated. In this work, we present the first study, to our knowledge, of the possible application of a small pixel sized SLM as a switching component in a WSS system.

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“…Several different techniques have therefore emerged for accurate measurement of retardation for various purposes (see e.g. Montarou et al ., 2006 and Zhang et al ., 2013, for reviews).…”

Section: Introductionmentioning

confidence: 99%

Segmentation, retardation and mass approximation of birefringent particles on a standard light microscope

Johnsen

Bollmann

2020

Journal of Microscopy

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Summary This study presents a simple technique for the approximation of retardation, thickness and mass of birefringent particles with a retardation from 8 to 231 nm retardation. Tuning of the imaging system (standard light microscope equipped with a left and a right circular polarizer) to match grey values of polymer retarder films of known retardation with rendered grey values allows for a robust calibration and accurate approximation of retardation. In addition, a technique for accurate particle segmentation using a Canny–Deriche algorithm was used to minimize the bias on mass estimated from different thresholding techniques. The technique was tested using microscopic calcitic plates called coccoliths produced by the marine algal group coccolithophores, and the results compare well with published coccolith mass estimates obtained from volumetric analysis. Lay Description Material with certain optical properties display interference colours when observed in a light microscope under circular polarized light. This study presents a simple technique for measuring the thickness and retardation of small particles within the 8 to 231 nm retardation range based on the grey values of their interference colours. Retardation is a measure of the distance between waves of two mutually perpendicular polarized light waves after passing through material. The technique involves the tuning of a standard light microscope system equipped with a left and a right circular polarizer and a digital camera to match grey values of polymer retarder films with a known retardation with grey values of a digitially rendered Michel‐Lévy chart. A technique for accurate isolation of particles from the image background using a Canny‐Deriche algorithm is also described, which avoids possible biased results from thresholding. The techniques were tested using microscopic calcitic plates called coccoliths produced by the marine algal group coccolithophores, and the results compare well with published estimates obtained from volumetric analysis.

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Methods for optical phase retardation measurement: A review

Cited by 26 publications

References 39 publications

Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry

Comprehensive characterization of a general composite waveplate by spectroscopic Mueller matrix polarimetry

LCoS SLM Study and Its Application in Wavelength Selective Switch

Segmentation, retardation and mass approximation of birefringent particles on a standard light microscope

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