Mineralogical Crystallography 2017
DOI: 10.1180/emu-notes.19.3
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Methods of crystallography: powder X-ray diffraction

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Cited by 5 publications
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“…However, weak diffraction peaks suggest the presence of a low fraction of franklinite also in the S10 sample. The weight fraction (wt%) of the different phases was determined by Rietveld full-profile fit on the SR-XRD patterns [55]. The data indicate that the amount of LTA formed by conventional hydrothermal method ranges from ∼91wt% in S5 to ∼98wt % in S3.…”
Section: Resultsmentioning
confidence: 99%
“…However, weak diffraction peaks suggest the presence of a low fraction of franklinite also in the S10 sample. The weight fraction (wt%) of the different phases was determined by Rietveld full-profile fit on the SR-XRD patterns [55]. The data indicate that the amount of LTA formed by conventional hydrothermal method ranges from ∼91wt% in S5 to ∼98wt % in S3.…”
Section: Resultsmentioning
confidence: 99%
“…) by the Rietveld method (Rietveld ; Altomare et al . ) using the GSAS package (with a pseudo‐Voigt profile function and a Chebyshev‐type polynomial to model the background curves; see Larson and Von Dreele ) and a combination of both, with ranciéite fraction higher than that of birnessite, showed the best fit with the ‘observed’ diffraction patterns. This finding proved that ranciéite and birnessite coexist in all the samples of this study (Table ).…”
Section: Resultsmentioning
confidence: 99%
“…A Bruker D8 DISCOVER (Bruker AXS, Frankfurt am Main, Germany) X-ray diffractometer with CuKα radiation was used for the phase analysis of the synthesized layers. The content of the phases in the surface layer was determined according to the X-ray diffraction patterns using the Rietveld method, using the FullProf software [72][73][74].…”
Section: Methodsmentioning
confidence: 99%