2014
DOI: 10.1088/1742-6596/483/1/012015
|View full text |Cite
|
Sign up to set email alerts
|

Metrological characterization of optical confocal sensors measurements (20 and 350 travel ranges)

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

1
7
0

Year Published

2014
2014
2022
2022

Publication Types

Select...
7
1

Relationship

0
8

Authors

Journals

citations
Cited by 9 publications
(8 citation statements)
references
References 6 publications
1
7
0
Order By: Relevance
“…This value is considered to be too large because the measurement precision is requested to be within few tens of nanometers. Based on this result and the works of Leach and Nouira et al, 11,27,28 the behavior of the chromatic confocal probe seems to be complex and sensitive to many parameters, particularly, gap variations (residual errors and linearity), material, roughness, form, reflectivity and inclination of the workpiece, power of the light source, acquisition frequency and scanning speed.…”
Section: Chromatic Confocal Probementioning
confidence: 53%
“…This value is considered to be too large because the measurement precision is requested to be within few tens of nanometers. Based on this result and the works of Leach and Nouira et al, 11,27,28 the behavior of the chromatic confocal probe seems to be complex and sensitive to many parameters, particularly, gap variations (residual errors and linearity), material, roughness, form, reflectivity and inclination of the workpiece, power of the light source, acquisition frequency and scanning speed.…”
Section: Chromatic Confocal Probementioning
confidence: 53%
“…Yang et al [26] reviewed a range of 3D surface measurement methods and determined that confocal laser measurement (CLM) is a suitable method for microscale surface characterization with high axial resolution and high signal-to-noise ratio. Nouira et al [27] studied confocal sensor behavior with respect to surface material and errors, which ensures the reliability of these types of sensors.…”
Section: Introductionmentioning
confidence: 99%
“…It is worth mentioning that some works have been carried out on characterization of metrological characteristics defined in ISO 25178-600 [22], such as amplification coefficient, linearity deviation, x-y perpendicularity deviation, etc. [23][24][25][26]. These metrological characteristics imply the whole instrumentation system's characteristics to some extent.…”
Section: Introductionmentioning
confidence: 99%