2011
DOI: 10.2355/isijinternational.51.93
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Micro-beam XRF and Fe–K Edge XAFS on the Cross Section of the Rust Layer Formed on a Weathering Steel

Abstract: Fig. 3. Optical microscopic image with polarized light (a), XRFintensity ratio image Cr-Ka/Fe-Ka measured by microbeam XRF with an energy of 7.8 keV (b), and Cr-Ka Xray intensity mapping measured by EPMA (c) for the cross section of the weathering steel exposed for 38 years. The images in (a), (b), and (c) were obtained from the identical area. EPMA mapping area is denoted by a dashed rectangle in (b). Points and line where XRF and XAFS spectra were recorded are denoted in figure (b).the difference of Cr conce… Show more

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Cited by 14 publications
(16 citation statements)
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“…5(b)) visualizes the differences of the materials with thin thickness down to few-tens nanometers on the surfaces. 15) The upper regions (position 1; sheet outgoing side) of the adhesive materials show remarkably darker contrast than the other regions (position 2). This result shows that the adhesive products on the die surface consist of two parts and suggests that the products showing darker contrast have lower electron conductivity than the other ones.…”
Section: Resultsmentioning
confidence: 95%
See 1 more Smart Citation
“…5(b)) visualizes the differences of the materials with thin thickness down to few-tens nanometers on the surfaces. 15) The upper regions (position 1; sheet outgoing side) of the adhesive materials show remarkably darker contrast than the other regions (position 2). This result shows that the adhesive products on the die surface consist of two parts and suggests that the products showing darker contrast have lower electron conductivity than the other ones.…”
Section: Resultsmentioning
confidence: 95%
“…The die surfaces were observed using low-voltage scanning electron microscopic techniques. [13][14][15] A model LEO1530 (LEO, now Carl Zeiss, Germany) was used in this study with accelerating voltages of 1 kV and 5 kV. Cross-sectional specimens of the die surfaces were made with a focused ion beam (FIB) instrument, FB2000A (Hitachi, Japan) for observations using the SEM and a TEM.…”
Section: Methodsmentioning
confidence: 99%
“…We have applied the XRF and XAFS to cross sectional analysis of the rust layer formed on a weathering steel sheet. 12) In that study, only major elements, iron and chromium, were analyzed. It is well known that trace elements such as Mo improve corrosion resistance.…”
Section: Discussionmentioning
confidence: 99%
“…To clarify this pinpoint chemical state of Cu, local analysis technique such as micro-beam XAFS is needed. 31) Questions still remain about quantitatively evaluating hydrogen-induced cracking. Consideration of localized hydrogen distribution that is induced by elastic stress concentration and the enhancement mechanism of concentrated hydrogen on cracking are still unclear.…”
Section: Hydrogen Absorption and Diffusionmentioning
confidence: 99%