Micro‐X‐Ray Fluorescence

Tsuji, Kouichi

doi:10.1002/9780470027318.a9067

Cited by 3 publications

(2 citation statements)

References 83 publications

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“…Imaging techniques using X-ray microbeams have rapidly developed and been applied to various analytical tasks in both synchrotron facilities and laboratories. [1][2][3][4] Microbeam analysis is typically used with a thin sample to ensure spatial resolution as small as the focused beam size. Non-destructive analysis is crucial for valuable objects where it may be difficult to obtain the thin samples, such as archeological or cultural heritage specimens, and for materials such as biological tissues, in which conventional thin-sample preparation causes deterioration of the internal structure.…”

Section: Introductionmentioning

confidence: 99%

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Elemental and chemical state depth analysis by combined use of a polycapillary and a thin wire in a synchrotron X-ray microprobe

Iida

2017

X-Ray Spectrom.

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A simple method is proposed to improve the depth resolution of a conventional X-ray confocal microscopy system by adding a thin wire close to the sample surface and upstream of the polycapillary in the exit channel. A depth resolution of around 10 μm is easily obtained. The detection efficiency is improved by a factor of two to three times, compared with the thin wire technique previously proposed. It is also shown that not only the elemental distribution but also the X-ray absorption near-edge structure (XANES) spectrum from locations below the sample surface can be obtained.

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Section: Introductionmentioning

confidence: 99%

“…Imaging techniques using X‐ray microbeams have rapidly developed and been applied to various analytical tasks in both synchrotron facilities and laboratories . Microbeam analysis is typically used with a thin sample to ensure spatial resolution as small as the focused beam size.…”

Section: Introductionmentioning

confidence: 99%

Elemental and chemical state depth analysis by combined use of a polycapillary and a thin wire in a synchrotron X-ray microprobe

Iida

2017

X-Ray Spectrom.

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X‐Ray Fluorescence Elemental Imaging

Tsuji¹

2023

Encyclopedia of Analytical Chemistry

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X‐ray fluorescence (XRF) imaging is a valuable analytical technique that provides elemental distribution maps. XRF imaging can be categorized as scanning‐type and non‐scanning‐type, that is full‐filed XRF imaging using a two‐dimensional X‐ray detector. Advanced X‐ray focusing optics produce a micro X‐ray beam in the laboratory, leading to scanning micro‐XRF analysis and XRF imaging. A confocal micro‐XRF technique has been applied to visualize the elemental distributions in the samples. The fundamentals and applications of the scanning‐type XRF imaging techniques are also introduced. Thereafter, two full‐field XRF imaging techniques are explained, that is, wavelength‐dispersive XRF (WDXRF) imaging and energy‐dispersive XRF (EDXRF) imaging. In addition, the characteristics of these XRF imaging techniques are compared.

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Studies About Atomic Compositions based on Synchrotron Radiation X- ray Microfluorescence (SR-μXRF) Analysis of Materials (at Micro- and Nano-Scale) Obtained by Sol-Gel Processes

Ysnaga

2024

AJPA

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Sol-gel is a wide-spread methodology for low-temperature synthesis of ceramics, nanocomposites and hybrid (inorganic-organic) materials. Ormosil (Organically Modified Silicates) belong to these class of hybrid materials, which have potential uses as optical materials, chemical sensors, catalysts, membranes, self-cleaning coatings. We are especially interested on the application of Synchrotron Radiation X-ray Microfluorescence (SR-μXRF) for the non-destructive analysis of such materials, benefiting of the high intensity obtained from this source of X-rays. SR-μXRF has demonstrated to be a useful analytical tool for qualitative and semi-quantitative determination of Hybrid films containing phosphotungstates ([PW12O40]3-/PWA), in order to determine the local concentration, as also the correlation among elements. For ormosil films, SR-μXRF enabled the qualitative determination of Titanium (Ti) that is heterogeneously distributed, oppositely to the case of Zinc (Zn) and Tungsten (W). For PI-ORMOSIL-PWA films, SR-μXRF maps have shown the heterogeneous distribution of the Silicon (Si) and a quasi-homogenous distribution of Tungsten (W). SR-μXRF results for Silicon (Si) and Tungsten (W) are consistent with the corresponding concentrations obtained by ICP-OES analyses, which were taken as the reference results. For PDMSUr-PWA films, SR-μXRF mapping have shown the heterogenous distribution pattern for Tungsten (W) and the capacity for the identification of Bromine (Br). For these materials NAA analyses were taken as the reference results for Tungsten (W). Furthermore, they are presented the HorRat parameters, in order to estimate approximately the degree of heterogeneity of these materials, which are in agree with the observed in the corresponding mappings obtained by SR-μXRF, giving hints about segregation at surface and at bulk level. HorRat parameters for concentrations obtained by ICP-OES and NAA (bulk analyses) are close to the expected value (2.0), which make possible using as reference values for SR-μXRF results (analyses at surface and medium-bulk levels), due to the non-existence of standards for these hybrid materials (at Micro- and Nano-Scale).

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Micro‐X‐Ray Fluorescence

Cited by 3 publications

References 83 publications

Elemental and chemical state depth analysis by combined use of a polycapillary and a thin wire in a synchrotron X-ray microprobe

Elemental and chemical state depth analysis by combined use of a polycapillary and a thin wire in a synchrotron X-ray microprobe

X‐Ray Fluorescence Elemental Imaging

Studies About Atomic Compositions based on Synchrotron Radiation X- ray Microfluorescence (SR-μXRF) Analysis of Materials (at Micro- and Nano-Scale) Obtained by Sol-Gel Processes

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