1997
DOI: 10.1002/(sici)1097-4539(199711/12)26:6<315::aid-xrs229>3.3.co;2-e
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Microbeam‐forming methods for synchrotron radiation

Abstract: The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E P 5 keV) microprobes. It is now possible to achieve intense submicron x-ray beams with a variety of techniques including Fresnel zone plates, Kirkpatrick-Baez mirrors, tapered capillaries and Bragg-Fresnel optics. These synchrotron-based x-ray microprobes can be used for ultra-sensitive elemental detection by x-ray Ñuorescence/absorption and for microdi †raction to identify phase and strain with su… Show more

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Cited by 6 publications
(7 citation statements)
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“…16 For this type of arrangements the angular acceptance is low, being determined by the critical angle in the equatorial plane. Multilayer mirrors can increase the angular range of specular reflection.…”
Section: Alternative Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…16 For this type of arrangements the angular acceptance is low, being determined by the critical angle in the equatorial plane. Multilayer mirrors can increase the angular range of specular reflection.…”
Section: Alternative Methodsmentioning
confidence: 99%
“…16 The use of such high precision devices is limited to high brilliance sources. They provide a sub-micron image resolution, but the lens dimensions have also to be very small (sub-millimeter).…”
Section: Alternative Methodsmentioning
confidence: 99%
“…Incident beam cross-sections less than 1 × 1 mm 2 can be achieved without sacrificing significant incident intensity using Kirkpatrick-Baez focusing mirrors. [56] For beam-sensitive samples, the balance between beam size and power density on the sample is an important consideration. For the diffracted beam, optics are chosen to improve the limited signal to background ratio in CTR measurements.…”
Section: X-ray Sources and Opticsmentioning
confidence: 99%
“…[5,8,[10][11] Synchrotron radiation X-ray fluorescence (SRXRF) spectroscopy, also known as synchrotron radiation induced X-ray emission (SRIXE) spectroscopy, has become competitive with the earlier microprobe and nanoprobe techniques following the development of X-ray focusing devices, such as the KirkpatrickBaez (KB) mirror and the zone plate, that are capable of micron and submicron resolution, respectively. [12][13][14][15] There are two important features that contribute to the superb elemental sensitivities of microprobe SRXRF: (i) the absence of the continuum (bremsstrahlung) background radiation that is a feature of spectra obtained from charged particle beams, and…”
Section: Microprobe X-ray Fluorescence Imagingmentioning
confidence: 99%