2017
DOI: 10.1063/1.5002911
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Micromagnetic modeling of tensomagnetoresistance effect in films with unidirectional anisotropy

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Cited by 3 publications
(2 citation statements)
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“…For thick layers deposited in non-stirring conditions either with and without a perpendicular applied magnetic field a K U of around 500⋅10 3 erg⋅cm − 3 has been obtained. Considering the theoretical value for the saturation magnetization M sat = 590 emu⋅cm − 3 [30], it is calculated a Q = 0.023 which means the layers have a moderate PMA. This is in agreement with the fact that periodicity of the stripe domains observed by MFM in these thick layers is similar to their thickness (Fig.…”
Section: Resultsmentioning
confidence: 99%
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“…For thick layers deposited in non-stirring conditions either with and without a perpendicular applied magnetic field a K U of around 500⋅10 3 erg⋅cm − 3 has been obtained. Considering the theoretical value for the saturation magnetization M sat = 590 emu⋅cm − 3 [30], it is calculated a Q = 0.023 which means the layers have a moderate PMA. This is in agreement with the fact that periodicity of the stripe domains observed by MFM in these thick layers is similar to their thickness (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Introducing the experimental value for K U in equation ( 3), and taking into account the reported value for Ni 90 Fe 10 , A ex = 1.4⋅10 − 6 erg⋅cm − 1 [30], it is calculated a t cr = 105 nm. This is an upper limit for t cr considering the method used to calculate K U .…”
Section: Resultsmentioning
confidence: 99%