Dramatic advances in synchrotron radiation sources produce ever-brighter beams of X-rays, but those advances can only be used if there is a corresponding improvement in X-ray detectors. With the advent of storage ring sources capable of being diffraction-limited (down to a certain wavelength), advances in detector speed, dynamic range and functionality is required. While many of these improvements in detector capabilities are being pursued now, the orders-ofmagnitude increases in brightness of diffraction-limited storage ring sources will require challenging non-incremental advances in detectors. This article summarizes the current state of the art, developments underway worldwide, and challenges that diffraction-limited storage ring sources present for detectors.Keywords: detectors; hybrid pixel detectors; monolithic pixel detectors; diffraction-limited storage rings; RIXS; XPCS; CXDI.1. Soft X-ray detectors
IntroductionFor soft X-ray (E < $ 2 keV) detection, low noise is essential. Gain can be used to overcome noise, for example microchannel plates (which tend to have low quantum efficiency) or avalanche photodiodes (which are used as point detectors). In silicon, 3.6 eV are required to produce one electron/hole pair, and, with a single-photon threshold of five times the noise, noise levels of less than 100 eV are required. As a consequence, soft X-ray direct detectors tend to be monolithic (with generally smaller, hence lower capacitance, pixels than hybrid detectors, described in x2), which adds constraints on the readout electronics. To date, variants of charge-coupled devices (CCDs) have been dominant as high-efficiency twodimensional detectors. Commercial detectors are generally thinned (tens of micrometres), back-illuminated, partially depleted CCDs. Pixel readout rates are comparatively slow ($ 1 Megapixel s
À1, due to the serial nature of CCD readout and the limited number of readout ports), although good noise can be achieved, particularly for detectors employing electron-multiplying readout. As shown in Fig. 1, for a fully depleted detector (Fig. 1b) there are no field-free regions and all charge is collected by drift. Spatial resolution is limited by scattering, and energy resolution is limited by readout noise and conversion statistics (Fano factor). In the case of a partially depleted detector (Fig. 1a), if the photon converts in the depleted region (as shown on the left) it behaves like a fully depleted detector. If the photon converts in the field-free region, however (as shown on the right), charge diffuses into 4. This not only degrades spatial resolution but also effects energy resolution, as some fraction of the diffusing charge will be lost to recombination.To overcome all of these limitations, the community has developed two CCD-based direct detectors (Denes et al., 2009;Strü der et al., 2010) with technical differences in the implementation, but both using thick (hundreds of micrometres) high-resistivity fully depleted silicon for high quantum efficiency and multiple readout ports for hig...