Chip on Glass (COG) technology is widely used to mount driver ICs on Liquid Crystal Display (LCD) substrates. This paper reports the development of Resin Core Bump technology as a novel COG technology. Unlike conventional COG bonding with Anisotropic Conductive Film (ACF), Resin Core Bump structures form stable interconnections by direct contact between the bump and the substrate. Moreover, the bump and its bonding structures are optimized to achieve a fine-pitch interconnection. Pitches as fine as 10 μm have been attained with 40 μm-pitch samples. In this study, we evaluated the fine pitch bondability and interconnection reliability of Resin Core Bumps using 20 μm pitch test samples. The ability to compensate for bonding accuracy by shrinking the bump width was also evaluated. Reliability was evaluated by a thermal cycle test. The initial contact resistance was even more stable than with a 40 μm conventional COG structure. The maximum resistance increment was less than 2.0 Ω after 2000 cycles.