Electrically Conductive Adhesives (ICAs: Isotropic Conductive Adhesives; ACAs: An-isotropic Conductive Adhesives; and NCAs: Non-conductive Adhesives) offer promising material solutions for fine pitch interconnects, low cost, low-temperature process and environmentally clean approaches in the electronic packaging technology. ICAs have been developed and used widely for traditional solder replacement, especially in surface mount devices and flip chip application. These also need to be lower cost with higher electrical/mechanical and reliability performances. ACAs have been widely used in flat panel display modules for high resolution, lightweight, thin profile and low power consumption in film forms (Anisotropic Conductive Films: ACFs) for last decades. Multi-layered ACF structures such as double and triple-layered ACFs were developed to meet fine pitch interconnection, low-temperature curing and strong adhesion requirements. Also, ACAs have been attracting much attention for their simple and lead-free processing as well as cost-effective packaging method for semiconductor packaging applications. High mechanical reliability, good electrical performance at high frequency level and effective thermal conductivity for high current density are some of required properties for ACF materials to be pursued for a wide usage in flip chip technology. Recently, NCAs are becoming promising for ultra-fine pitch interconnection and low cost joining materials in electronic packaging applications.In this paper, an overview of the recent developments and applications of electrically conductive adhesives for electronic packaging with focus on fine pitch capability, electrical/mechanical/thermal performance and wafer level packaging application is presented.

No abstract

No abstract

Recently, the research and development activities for replacing Pb-containing solders with Pb-free solders have been intensified due to both competitive market pressures and environmental issues. As a result of these activities, a few promising candidate solder alloys have been identified, mainly, Sn-based alloys. A key issue affecting the integrity and reliability of solder joints is the interfacial reactions between a molten solder and surface finishes in the solder joint structures. In this paper, a fundamental study of the interfacial reactions between several Pb-free candidate solders and surface finishes commonly used in printed-circuit cards is reported. The Pb-free solders investigated include Sn-3.5 Ag, Sn-3.8 Ag-0.7 Cu, and Sn-3.5 Ag-3.0 Bi. The surface finishes investigated include Cu, Au/Ni(P), Au/Pd/Ni(P), and Au/Ni (electroplated). The reaction kinetics of the dissolution of surface finishes and intermetallic compound growth have been measured as a function of reflow temperature and time. The intermetallic compounds formed during reflow reactions have been identified by SEM with energy dispersive x-ray spectroscopy.Index Terms-Dissolution, electroless Ni(P), interfacial reactions, intermetallics, morphology, Pb-free solders, Sn-3.5Ag, Sn-3.5Ag-3Bi, Sn-3.8Ag-0.7Cu.

One of the most important issues whether anisotropic conductive film (ACF) interconnection technology is suitable to be used for flip chip on organic board applications is thermal cycling reliability. In this study, thermally induced deformations and warpages of ACF flip chip assemblies as a function of distance from neutral point (DNP) and ACF materials properties were investigated using in situ high sensitivity moire´ interferometry. For a nondestructive failure analysis, scanning acoustic microscopy investigation was performed for tested assemblies. To elucidate the effects of ACF material properties and DNP on the thermal cycling reliability of ACF assembly, Weibull analysis for the lifetime estimation of ACF joint was performed, and compared with thermal deformations of ACF flip chip assembly investigated by moire´ interferometry. Results indicate that the properties of ACF have a significant role in the thermal deformation and reliability performance during thermal cycling testing. Therefore, optimized ACF properties can enhance ACF package reliability during thermal cycling regime.