1994
DOI: 10.1051/mmm:019940050101900
|View full text |Cite
|
Sign up to set email alerts
|

Microscope à double détection : STOM-AFM, principe et résultats

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1996
1996
1999
1999

Publication Types

Select...
3

Relationship

0
3

Authors

Journals

citations
Cited by 3 publications
(1 citation statement)
references
References 6 publications
0
1
0
Order By: Relevance
“…Moreover, the tip size, the tip collection angle, the tip manufacturing, the tip position can influence the images [13,[32][33][34][35][36][37]. Contrast inversion in regards of the roughness may even be observed [10,12,[38][39][40]. This [17,38].…”
Section: Optical Near Field Artefacts: the Problem Of Resolutionmentioning
confidence: 99%
“…Moreover, the tip size, the tip collection angle, the tip manufacturing, the tip position can influence the images [13,[32][33][34][35][36][37]. Contrast inversion in regards of the roughness may even be observed [10,12,[38][39][40]. This [17,38].…”
Section: Optical Near Field Artefacts: the Problem Of Resolutionmentioning
confidence: 99%