1983
DOI: 10.1002/pssa.2210750216
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Microscopic degradation model for ZnO varistors

Abstract: On the basis of considerations about classic diffusion and migration in crystalline solids with prevailing ionic bonding a microscopic degradation equation for ZnO varistors is developed, where different possibilities of Coulomb potential deflection at phase boundaries are included. The model is compared with experimental results of degradation and recovery of ZnO varistors under dc loading and without loading.

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Cited by 3 publications
(1 citation statement)
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“…How to control or reduce the long-term degradation effect remains one of the major challenges for the investigators. In general, the degradation [1][2][3][4][5][6][7][8] refers to a gradual increase (steady or slow) in leakage current under the electric pulse stress or constant applied voltage. Many early investigators [9][10][11][12] had recommended some remedial steps such as heat-treatment (annealing) in conjunction with the adjustment in the varistor formulation and processing variables to control the degradation process for better stability of the device under applications.…”
Section: Introductionmentioning
confidence: 99%
“…How to control or reduce the long-term degradation effect remains one of the major challenges for the investigators. In general, the degradation [1][2][3][4][5][6][7][8] refers to a gradual increase (steady or slow) in leakage current under the electric pulse stress or constant applied voltage. Many early investigators [9][10][11][12] had recommended some remedial steps such as heat-treatment (annealing) in conjunction with the adjustment in the varistor formulation and processing variables to control the degradation process for better stability of the device under applications.…”
Section: Introductionmentioning
confidence: 99%