2009
DOI: 10.1016/j.solmat.2008.11.061
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Microscopic homogeneity of emitters formed on textured silicon using in-line diffusion and phosphoric acid as the dopant source

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Cited by 17 publications
(17 citation statements)
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“…Commonly 1,000 wafers are loaded in a single tube and with five diffusion tubes in a batch-type diffusion system, a throughput of up to 3,800 wafers/h can be achieved for solar cell manufacturing. Industrial Silicon Solar Cells DOI: http://dx.doi.org/10.5772/intechopen.84817 An inline diffusion system where the wafers are transported on a belt with phosphoric acid as the source of P dopants was also used in commercial production [32]. However, compared to the inline process, the batch process is more clean, effective and efficient.…”
Section: Emitter Diffusionmentioning
confidence: 99%
“…Commonly 1,000 wafers are loaded in a single tube and with five diffusion tubes in a batch-type diffusion system, a throughput of up to 3,800 wafers/h can be achieved for solar cell manufacturing. Industrial Silicon Solar Cells DOI: http://dx.doi.org/10.5772/intechopen.84817 An inline diffusion system where the wafers are transported on a belt with phosphoric acid as the source of P dopants was also used in commercial production [32]. However, compared to the inline process, the batch process is more clean, effective and efficient.…”
Section: Emitter Diffusionmentioning
confidence: 99%
“…The experimental determination of the impact of texturing upon emitter recombination is complicated by the near impossibility of achieving identical profiles on textured surfaces [1], [13], [16], since the diffusion of dopants is either enhanced or retarded by the convex and concave features on a textured surface [17], [18].…”
Section: Experimental Results-diffused Surfacesmentioning
confidence: 99%
“…SEM is often used to image structural defects associated with shunts like crystallographic defects [148], material defects [151], precipitates [148], and etch-pits [41,152,154]. For non-linear shunts caused by gaps in doping, SEM can be used to monitor PSG coverage uniformity [87] and SE contrasting can be used to confirm local doping inhomogeneities [85][86][87]. TEM has also been used for high resolution imaging of recombination active crystal defects as well as Si 3 N 4 inclusions and SiC precipitates [148].…”
Section: Shunts and Junction Pre-breakdown Metrologymentioning
confidence: 99%
“…Being able to image the p-n junction allows for the detection of discontinuities, which can be missed with one-dimensional profiling techniques. The EBIC method [81] and secondary electron (SE) contrast imaging [82][83][84][85][86][87], both performed in a SEM, are well suited for solar cell emitter characterization. The final product for the end-user is the module (as part of a PV installation), and not individual solar cells, therefore additional understanding is required to determine what role if any the emitter formation process plays in module reliability.…”
Section: Introductionmentioning
confidence: 99%