2012
DOI: 10.1016/j.jmmm.2011.08.033
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Microstructural and domain effects in epitaxial CoFe2O4 films on MgO with perpendicular magnetic anisotropy

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Cited by 23 publications
(7 citation statements)
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“…22 A 12-nm CFO film was then deposited on the substrate using pulsed electron deposition (PED). 23, 24 The CFO film grows via the Volmer-Weber epitaxial growth mode, producing epitaxial islands on the surface. 25 An atomic force microscopy (AFM) surface topography scan after the growth is shown in Fig.…”
mentioning
confidence: 99%
“…22 A 12-nm CFO film was then deposited on the substrate using pulsed electron deposition (PED). 23, 24 The CFO film grows via the Volmer-Weber epitaxial growth mode, producing epitaxial islands on the surface. 25 An atomic force microscopy (AFM) surface topography scan after the growth is shown in Fig.…”
mentioning
confidence: 99%
“…The large K 1 arises from a spinorbit stabilized doublet ground state of the d 7 electronic configuration of the Co 2þ cations, which is caused by a trigonal crystal field of the Co 2þ cations (Dionne, 2009;Slonczewski, 1958a,b;Tachiki, 1960) and has resulted in CoFe 2 O 4 being included in a number of strain-driven multiferroic devices (Park et al, 2010;Zavaliche et al, 2005;Zhang, Deng, Ma, Lin, & Nan, 2008;Zheng et al, 2004). Coherently strained thin films have an out-of-plane easy axis, as predicted by their large, positive K 1 constant (Chambers et al, 2002;Comes, Gu, Khokhlov, Lu, & Wolf, 2012;Dhakal et al, 2010;Dorsey, Lubitz, Chrisey, & Horwitz, 1996;Lisfi et al, 2007;. Coherently strained thin films have an out-of-plane easy axis, as predicted by their large, positive K 1 constant (Chambers et al, 2002;Comes, Gu, Khokhlov, Lu, & Wolf, 2012;Dhakal et al, 2010;Dorsey, Lubitz, Chrisey, & Horwitz, 1996;Lisfi et al, 2007;.…”
Section: Magnetic Anisotropy Of Cofe 2 Omentioning
confidence: 91%
“…Additionally, the presence of dislocations or antiphase boundaries in CFO has been shown to reduce the saturation magnetization of the material and reduce the energy barrier to form magnetic domain walls. [31][32][33] Thus, the structural defects that are present in this pillar could negatively affect the performance of the CFO-BFO nanocomposite in a memory or logic device. Further studies are needed to determine the best means to produce uniform microstructure in pillars over a large pattern area.…”
Section: Microstructural Effectsmentioning
confidence: 99%