2018
DOI: 10.1007/s11837-018-2982-1
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Microstructural Investigations in Metals Using Atom Probe Tomography with a Novel Specimen-Electrode Geometry

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Cited by 7 publications
(5 citation statements)
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“…Local range-assisted background subtraction with 0.15 Da sidebands was used for composition background correction. The instrument is equipped with a wide-angle reflector, 26 with a detection efficiency of 37%. The ideal spatial resolution in depth of the instrument is B0.1 nm.…”
Section: Characterizationmentioning
confidence: 99%
“…Local range-assisted background subtraction with 0.15 Da sidebands was used for composition background correction. The instrument is equipped with a wide-angle reflector, 26 with a detection efficiency of 37%. The ideal spatial resolution in depth of the instrument is B0.1 nm.…”
Section: Characterizationmentioning
confidence: 99%
“…In 2016, CAMECA ® introduced a lower cost of ownership atom probe. The EIKOS™, with a simplified design and a smaller footprint than the LEAP 5000™ (Local Electrode Atom Probe) makes it possible for a wider range of research institutions to include atom probe tomography as a routine part of their materials characterization process [2].…”
mentioning
confidence: 99%
“…Figures1 b and c show the sharpening process. Figure 1d shows a transmission EBSD map highlighting the Σ9 grain boundary position within the final needle-shaped specimen.Ion distribution maps from atom probe analysis are shown in Figure 2a-c for Inconel 718 [3]. The density map in Figure 2a shows a density discontinuity at the grain boundary position because of differing field evaporation characteristics at the boundary.…”
mentioning
confidence: 99%
“…Ion distribution maps from atom probe analysis are shown in Figure 2a-c for Inconel 718 [3]. The density map in Figure 2a shows a density discontinuity at the grain boundary position because of differing field evaporation characteristics at the boundary.…”
mentioning
confidence: 99%
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