Microstructural properties of ZnO:Sn thin films deposited by intermittent spray pyrolysis process

Allah, F. Kadi; Cattin, Linda; Morsli, M.; Khelil, A.; Langlois, Nicole I.; Bérnède, J.C.

doi:10.1007/s10854-009-9890-7

Cited by 4 publications

(1 citation statement)

References 14 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In estimating the optical energy band gap of semiconducting materials, UV-vis spectra play a critical role. The following expression depicts the optical band gap: 16,17)…”

Section: Resultsmentioning

confidence: 99%

Low-frequency noise properties of metal–organic–metal ultraviolet sensors

Chuang

Chen

et al. 2015

Jpn. J. Appl. Phys.

View full text Add to dashboard Cite

3-methylphenyl(phenyl)amino]triphenylamine (m-MTDATA) thin films of various thicknesses were fabricated successfully, and their low-frequency noise (LFN) characteristics were also analyzed. The findings revealed that the UV-to-visible rejection ratio of the fabricated 80-nm-thick m-MTDATA UV sensor was approximately 7.81 when biased at 5 V, with a cutoff at 220 nm. With an incident light wavelength of 220 nm and an applied bias of 5 V, the measured responsivity of the 80-nm-thick m-MTDATA UV sensor was found to be 2.84 ' 10 %4 A/W. Furthermore, a noise-equivalent power (NEP) of 9.8 ' 10 %11 W and a detectivity (D * ) of 8.3 ' 10 8 cm Hz 0.5 W %1 can be achieved using the fabricated 80-nm-thick m-MTDATA UV sensor.

show abstract

“…In estimating the optical energy band gap of semiconducting materials, UV-vis spectra play a critical role. The following expression depicts the optical band gap: 16,17)…”

Section: Resultsmentioning

confidence: 99%

Low-frequency noise properties of metal–organic–metal ultraviolet sensors

Chuang

Chen

et al. 2015

Jpn. J. Appl. Phys.

View full text Add to dashboard Cite

show abstract

XPS and DFT study of Sn incorporation into ZnO and TiO₂host matrices by pulsed ion implantation

Zatsepin

Boukhvalov

Kurmaev

et al. 2015

Phys. Status Solidi B

View full text Add to dashboard Cite

Bulk and thin-film ZnO and TiO 2 samples were doped with Sn by pulsed ion implantation and studied by means of X-ray photoelectron core-level and valence-band spectroscopy as well as density functional theory calculations for a comprehensive study of the incorporation of Sn. XPS spectral analysis showed that isovalent Sn cation substitution occurs in both zinc oxide (Sn 2þ !Zn 2þ ) and titanium dioxide (Sn 4þ !Ti 4þ ) for bulk and film morphologies. For TiO 2 films, the implantation also led to occupation of interstitials by dopant ions, which induced the clustering of substituted and embedded Sn atoms; this did not occur in ZnO:Sn film samples. Density functional theory (DFT) formation energies were calculated of various incorporation processes, explaining the prevalence of substitutional defects in both matrices. Possible mechanisms and reasons for the observed trends in Sn incorporation into the ZnO and TiO 2 matrices are discussed.

show abstract

Optical Parameters of ZnO Thin Films

Ikhmayies¹

2023

The Minerals, Metals &Amp; Materials Series

View full text Add to dashboard Cite

Microstructural properties of ZnO:Sn thin films deposited by intermittent spray pyrolysis process

Cited by 4 publications

References 14 publications

Low-frequency noise properties of metal–organic–metal ultraviolet sensors

Low-frequency noise properties of metal–organic–metal ultraviolet sensors

XPS and DFT study of Sn incorporation into ZnO and TiO₂host matrices by pulsed ion implantation

Optical Parameters of ZnO Thin Films

Contact Info

Product

Resources

About

Microstructural properties of ZnO:Sn thin films deposited by intermittent spray pyrolysis process

Cited by 4 publications

References 14 publications

Low-frequency noise properties of metal–organic–metal ultraviolet sensors

Low-frequency noise properties of metal–organic–metal ultraviolet sensors

XPS and DFT study of Sn incorporation into ZnO and TiO2host matrices by pulsed ion implantation

Optical Parameters of ZnO Thin Films

Contact Info

Product

Resources

About

XPS and DFT study of Sn incorporation into ZnO and TiO₂host matrices by pulsed ion implantation