2004
DOI: 10.1016/j.physb.2004.08.013
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Microstructure and electrical conductivity of In-doped CdS thin films

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Cited by 36 publications
(13 citation statements)
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“…Some Au atoms may have occupied the lattice sites to play directly as a dopant. Au atoms can create impurities in the bandgap, but the observation is in agreement with the cases of In-doped CdS19 and Al- and Sb-doped CdTe20, which showed a decrease in activation energy with increasing dopant concentrations. In summary, the increase in conductance with Au embedment was analyzed, but a concrete conclusion cannot be elucidated at present and separate systematic study is necessary.…”
Section: Resultssupporting
confidence: 80%
“…Some Au atoms may have occupied the lattice sites to play directly as a dopant. Au atoms can create impurities in the bandgap, but the observation is in agreement with the cases of In-doped CdS19 and Al- and Sb-doped CdTe20, which showed a decrease in activation energy with increasing dopant concentrations. In summary, the increase in conductance with Au embedment was analyzed, but a concrete conclusion cannot be elucidated at present and separate systematic study is necessary.…”
Section: Resultssupporting
confidence: 80%
“…Grain size variations in metal‐doped sulfide thin films are also seen in the works of Prathap et al . and Megahid et al . The average surface roughness ( R a ) of ZnS film is ~2.5 nm, whereas the root mean square ( R rms ) roughness is ~3.2 nm.…”
Section: Resultssupporting
confidence: 56%
“…B. Observed Cu2p 3/2,1/2 peaks at 932.5 and 952.4 eV without satellites are attributed to Cu + species . Zn2p core level spectra of ZnS and Cu/ZnS films displayed in Fig.…”
Section: Resultsmentioning
confidence: 93%
“…The strong and broad peak for all films around 26.66° gives it is the preferred orientations along the (002) plane of hexagonal phase which also revealed the existence of better crystalline nature and it is suitable for photocatalytic reaction [36]. Megahid et al demonstrated that the diffractogram includes one characterizing peak for the preferred orientations (0 0 2) plane of CdS film at 400 °C [37]. The FWHM (Full Width at Half Maximum) of the XRD peaks was slightly changing by the dopant ratio owing to variations in grain size.…”
Section: Structural Studiesmentioning
confidence: 96%