2008
DOI: 10.1016/j.intermet.2007.10.009
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Microstructure and failure mode of Sn–37Pb soldered in laser diode packages

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Cited by 2 publications
(1 citation statement)
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“…Interfacial reactions affect significantly the reliability of electronic joints [3][4][5][6][7][8][9][10]. The interfacial reactions in the Au/Sn/Cu structure have been examined by Chang et al [5], and Sn is considered as the solder material, which is thicker than Au and Cu and is not exhausted during reaction.…”
Section: Introductionmentioning
confidence: 99%
“…Interfacial reactions affect significantly the reliability of electronic joints [3][4][5][6][7][8][9][10]. The interfacial reactions in the Au/Sn/Cu structure have been examined by Chang et al [5], and Sn is considered as the solder material, which is thicker than Au and Cu and is not exhausted during reaction.…”
Section: Introductionmentioning
confidence: 99%