2006
DOI: 10.1016/j.tsf.2006.01.049
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Microstructure and optical properties of TiO2 thin films prepared by low pressure hot target reactive magnetron sputtering

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Cited by 68 publications
(30 citation statements)
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“…For TiO2, tensile stress was again observed. The type of stress occurring in measured coatings was determined on the basis of the Δd parameter from the following equation [34]:…”
Section: Resultsmentioning
confidence: 99%
“…For TiO2, tensile stress was again observed. The type of stress occurring in measured coatings was determined on the basis of the Δd parameter from the following equation [34]:…”
Section: Resultsmentioning
confidence: 99%
“…Our results of hardness measurements for TiO 2 films as deposited in a standard sputtering process and having the anatase structure, have shown that the hardness of the film, directly after deposition, was about 3 GPa. Even after additional annealing at 800°C, which results in recrystalization of the anatase into the rutile structure [21], hardness of the film was only about 8 GPa. This confirms that the higher hardness value of the film was caused by an increase of the film nanocrystallinity.…”
Section: Resultsmentioning
confidence: 99%
“…Application of pure oxygen plasma as compared to conventional process results that prepared thin films were characterized by dense, homogeneous and stoichiometric structure [16,17]. However, in case of HE RMS, XRD investigations reveal presence of fine-crystalline rutile structure with preferred (110) plane orientation [21,22].…”
Section: Resultsmentioning
confidence: 99%
“…The processes applied by the authors termed as LP HTRS [16] and high HE RMS [12] employed combination of different operation modes used in modified sputtering processes [1,7,9]. In both processes thin films of TiO 2 were prepared under low pressure (0.1 Pa) of oxygen (purity 99.99%) plasma using titanium disc (purity 99.99%) 100 mm in diameter and 3.8 mm thick.…”
Section: Methodsmentioning
confidence: 99%
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