1988
DOI: 10.1116/1.575477
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Microstructure of sputtered metal films grown in high- and low-pressure discharges

Abstract: Sputtered metal films grown in different discharge environments are subject to different degrees of energetic particle bombardment during film growth, resulting in different microstructure and subsequent thin-film properties. The effect on film structure of energetic gas neutrals, backscattered from the sputtering target, together with the role of sputtered neutral metal atoms and those Penning ionized in traversing the plasma, are evaluated in different pressure regimes and under different biasing conditions.… Show more

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Cited by 49 publications
(11 citation statements)
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“…Much of the work on plasma deposition of metal-polymer nanocomposites has been pioneered by Kay et al [35][36][37][38] Up to now the most common approach is sputtering from a metal target and simultaneous plasma polymerization of organic precursors. This approach allows a large variety of metals and polymeric matrices to be combined.…”
Section: Plasma Polymerizationmentioning
confidence: 99%
“…Much of the work on plasma deposition of metal-polymer nanocomposites has been pioneered by Kay et al [35][36][37][38] Up to now the most common approach is sputtering from a metal target and simultaneous plasma polymerization of organic precursors. This approach allows a large variety of metals and polymeric matrices to be combined.…”
Section: Plasma Polymerizationmentioning
confidence: 99%
“…It is well known that low energy working gas ion bombardment during deposition of thin films has a significant influence on the structure and properties of the growing film, including degree and direction of orientation, grain size, the film density, and film stress. 7,8,28 Increased ionization of the sputtered vapor also gives improvement of the film quality, such as density, [29][30][31] FIG. 1.…”
Section: Introductionmentioning
confidence: 99%
“…Since the argon was removed and oxygen cannot Penning ionize Al, 17 this implies that the Penning process is not important in our case, as expected due to the low pressure. 18 In the following calculations, we thus assume that the main ionization mechanism is by electron impact.…”
mentioning
confidence: 99%