2020
DOI: 10.1039/d0nr04589f
|View full text |Cite
|
Sign up to set email alerts
|

Minimising damage in high resolution scanning transmission electron microscope images of nanoscale structures and processes

Abstract: Determining the optimum electron dose distribution for damage mitigated scanning transmission electron microscopy imaging using subsampling and image inpainting.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
28
0

Year Published

2021
2021
2024
2024

Publication Types

Select...
10

Relationship

2
8

Authors

Journals

citations
Cited by 49 publications
(28 citation statements)
references
References 19 publications
(19 reference statements)
0
28
0
Order By: Relevance
“…These controls can be applied to any liquid system (not just water) greatly increasing the number of chemical experiments that can be performed in the microscope. Furthermore, when adopting advanced elements such as beam broadening 38 , more precise and subtle controls will also be available.…”
Section: Physical Chemistry Chemical Physics Accepted Manuscriptmentioning
confidence: 99%
“…These controls can be applied to any liquid system (not just water) greatly increasing the number of chemical experiments that can be performed in the microscope. Furthermore, when adopting advanced elements such as beam broadening 38 , more precise and subtle controls will also be available.…”
Section: Physical Chemistry Chemical Physics Accepted Manuscriptmentioning
confidence: 99%
“…The two main damage types that samples experience are displacement effects and breaking of chemical bonds 46 . Imaging in TEM and STEM mode can generate similar integrated doses and dose rates but in TEM mode, a defined area for the entire image is illuminated, whereas a smaller area of the sample is illuminated with a similar peak dose/rate in STEM mode than the larger area in TEM mode (during the same acquisition time) 46 . Thus, an individual nanoparticle in, for example, a FIB section is exposed to a higher peak dose/rate in STEM than TEM mode.…”
Section: Sem-edsmentioning
confidence: 99%
“…Nonetheless, it is important to point out that these methods can be applied to low dose settings when compared with the raster scan approach. Due to the reduced times achieved, sensitive materials, prone to damage by not only the total electron dose but also the dose rate, could be imagined, while also reducing drift and charging effects as the electron irradiation becomes more spread out 25 .…”
Section: Resultsmentioning
confidence: 99%