“…a-Si:H ®lms, however, usually combine a large w, due to a low effective carrier density, with a small L, due to the great density of trapping centers. Numerical simulations of Goodman plots [469] showed that as w is increased with respect to L, L app is increased such that L app $ L w. This indicates that if L ) w is violated, L app should be treated as a ®eld-enhanced collection length [471], which is roughly equal to the sum of the diffusion (L) and ®eld (w) collection lengths. This interpretation was later con®rmed experimentally by combining SPV and C-V measurements [476].…”