2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC &Amp 2018
DOI: 10.1109/pvsc.2018.8547969
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Miracle: Material Independent Rear Passivating Contact Solar cells using optimized texture and novel p+poly-Si hydrogenation

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Cited by 2 publications
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“…The increased recombination can instead be related to a net higher defect density at the SiO x / c -Si interface, ,, which now has a dominant Si(111) crystallographic orientation on a textured Si surface instead of Si(100) orientation on a planar surface. Although it has been reported that the SiO x /Si­(111) interface has a higher defect density than a SiO x /Si­(100) interface for thermally grown SiO 2 layers, morphological modifications to the pyramidal surface texture such as rounding of the pyramid tips or valleys between pyramids improves poly -Si/SiO x contact passivation. , This is observed despite the fact that there is only a minimal change in the Si(111) surface area fraction. Additionally, by controlling the dopant profiles and by hydrogenation of the contact structure, improved passivation of textured c -Si wafers was reported with J o < 10 fA/cm 2 , but this did not result in high-efficiency cells .…”
Section: Introductionmentioning
confidence: 98%
“…The increased recombination can instead be related to a net higher defect density at the SiO x / c -Si interface, ,, which now has a dominant Si(111) crystallographic orientation on a textured Si surface instead of Si(100) orientation on a planar surface. Although it has been reported that the SiO x /Si­(111) interface has a higher defect density than a SiO x /Si­(100) interface for thermally grown SiO 2 layers, morphological modifications to the pyramidal surface texture such as rounding of the pyramid tips or valleys between pyramids improves poly -Si/SiO x contact passivation. , This is observed despite the fact that there is only a minimal change in the Si(111) surface area fraction. Additionally, by controlling the dopant profiles and by hydrogenation of the contact structure, improved passivation of textured c -Si wafers was reported with J o < 10 fA/cm 2 , but this did not result in high-efficiency cells .…”
Section: Introductionmentioning
confidence: 98%
“…Both alloying strategies lead to a trade-off between transparency and conductivity [106], [109]. A second difficulty is the application of the TOPCon structure on a textured surface where, once again, p-type contacts are more problematic than n-type contacts [110], [111]. The best efficiency reached to date in a device with full-area TOPcon passivating contacts at the front and rear is 22.6% [112].…”
Section: High-temperature Passivating Contactsmentioning
confidence: 99%